|
CNS |
|
General No. |
CNS 15531 |
| Classified No. |
C3234 |
Methods of quality test on light emitting diode dies
發光二極體晶粒之品質試驗法 |
Date of Approval
|
Bureau of Standards,
Metrology and Inspection |
Date of
Revision
|
|
|
Thanks for your interest in
"CNS 15531" standard !
This CNS Standard is not ready translated, only after get your order, then we translate it, time usually need more 3-5 days !
|
 |
| CNS
Standard Code |
CNS 15531:2021 |
| CNS Standard Classified No. |
C3234 |
|
CNS Standard English Title |
Methods of quality test on light emitting diode dies |
|
CNS Standard Chinese Title |
發光二極體晶粒之品質試驗法 |
|
CNS Standard Edition |
Status：Current; Latest date：01/31/2012 Confirmed date：12/06/2021 |
|
CNS Standard Pages |
11 |
| Chinese Version Price |
$*** |
| English Translation Price |
$***
USD |
|
Sale Price |
Inquire us for detail price
|
Relevant CNS Standards about CNS 15531 >>>
|
+86-755-25831330
