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CNS |
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General No. |
CNS 13623 |
| Classified No. |
C6359 |
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） |
Date of Approval
|
Bureau of Standards,
Metrology and Inspection |
Date of
Revision
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"CNS 13623" standard !
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|
 |
| CNS
Standard Code |
CNS 13623:2017 |
| CNS Standard Classified No. |
C6359 |
|
CNS Standard English Title |
Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) |
|
CNS Standard Chinese Title |
單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） |
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CNS Standard Edition |
Status：Current; Latest date：12/21/1995 Confirmed date：09/12/2017 |
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CNS Standard Pages |
10 |
| Chinese Version Price |
$*** |
| English Translation Price |
$***
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|
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