"M " CNS Standards Search Result

1. Ready translated english version CNS Standards ( SALE mark ) and Chinese version CNS Standards, you can purchase directly in the web page; After receive your payment, we will send the CNS Standards PDF file to your Email within 1~3 days.
2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days .


	CNS 12511 - English Version General Rules for Mass Spectrometric Analysis 質譜分析法通則 - 英文版
	CNS 12512 - English Version General Rules for Analytical Methods in High Performance Liquid Chromatography 高效能液相層析分析法通則 - 英文版
	CNS 12507 - English Version Measuring Methods for Liquid Crystal Display Panel 液晶顯示板測量法 - 英文版
	CNS 12426 - English Version Pulps - Preparation of laboratory sheets for Measurement of reflectance 紙漿－供光學性質測定之試樣製備法 - 英文版
	CNS 13723 - English Version ExtensoMeters Used in Metallic Material Tensile 金屬材料拉伸試驗用伸長計 - 英文版
	CNS 13791 - English Version Measuring Methods of Optical Attenuator for Communication 通信用光衰減器量測法 - 英文版
	CNS 13625 - English Version Product Specifications for Round Polished Monocrystalline Gallium Arsenide Wafers 圓形砷化鎵單晶片產品標準 - 英文版
	CNS 13648 - English Version Measuring Methods for Laser Diode(for Communication) 通信用雷射二極體量測法 - 英文版
	CNS 13649 - English Version Reliability Testing for Laser Diode(for CoMmunication) 通信用雷射二極體之可靠度測試 - 英文版
	CNS 13650 - English Version Lot-Control Testing for Laser Diode(for CoMmunication) 通信用雷射二極體之批品質控制測試 - 英文版
	CNS 13651 - English Version Measuring Methods for Light Emitting Diode(for Communication) 通信用發光二極體量測法 - 英文版
	CNS 13652 - English Version Reliability Testing for Light EMitting Diode(for Communication) 通信用發光二極體之可靠度測試 - 英文版
	CNS 13653 - English Version Lot-Control Testing for Light EMitting Diode(for Communication) 通信用發光二極體之批品質控制測試 - 英文版
	CNS 13654 - English Version Measuring Methods for Photodiode(for Communication) 通信用光二極體量測法 - 英文版
	CNS 13655 - English Version Reliability Testing for Photodiode(for CoMmunication) 通信用光二極體之可靠度測試 - 英文版
	CNS 13623 - English Version Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） - 英文版
	CNS 13657 - English Version Guidelines for quality Management system documentation 品質管理系統文件化指導綱要 - 英文版
	CNS 13622 - English Version Fixed chip resistor for use in electronic equipMent 電子設備用固定晶片電阻器 - 英文版
	CNS 13724 - English Version Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 - 英文版
	CNS 13725 - English Version Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 - 英文版
	CNS 13726 - English Version Method of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 - 英文版
	CNS 13727 - English Version Method of Test for Volume Resistivity of Conductive Adhesives 導電膠之體積電阻率量測法 - 英文版
	CNS 13779 - English Version Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 - 英文版
	CNS 13780 - English Version Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 - 英文版
	CNS 13781 - English Version Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） - 英文版
	CNS 13782 - English Version Realiability Assured Infrared EMitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 - 英文版
	CNS 14001 - English Version EnvironMental management systems − Requirements with guidance for use 環境管理系統－附使用指引之要求事項 - 英文版
	CNS 13438 - English Version InforMation technology equipment - Radio disturbance characteristics - Limits and methods of measurement 資訊技術設備－射頻擾動特性－限制值與量測方法 - 英文版	Translated
	CNS 13656 - English Version Lot-Control Testing for Photodiode(for CoMmunication) 通信用光二極體之批品質控制測試 - 英文版
	CNS 13517 - English Version Large diaMeter welded stainless steel pipes 配管用銲接大口徑不銹鋼鋼管 - 英文版

Find out:12524Items | To Page of: First -Previous-Next -Last | [329] [330] [331] [332] [333] [334] [335]