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    2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days .
         
    CNS 12566 - English Version
    Basic Environmental Testing Procedures Part 2: Tests, Test Z/AD:Composite Temperature/Humidity Cyclic Test
    環境試驗法(電氣、電子)-溫濕度組合(循環)試驗 - 英文版

    CNS 12359 - English Version
    Method of Test for Fiber Optic Devices ( FOTP-66 Measuring Relative Abrasion Resistance of Optical Waveguide Coating and Buffers)
    光纖裝置檢驗法(鍍層及緩衝層耐磨性之測量FOTP-66) - 英文版

    CNS 12375 - English Version
    Method of test for extreme-pressure properties of lubricating fluids (Timken method)
    潤滑油極壓性能試驗法(Timken 法) - 英文版

    CNS 12378 - English Version
    Method of test for load-carrying capacity for lubricating oil (FZG gear machine method)
    潤滑油負載能力試驗法(FZG法) - 英文版

    CNS 12495 - English Version
    Laboratory Beating of Pulp (Beater Method)
    實驗室紙漿叩解法(打漿機法) - 英文版

    Translated
    CNS 12496 - English Version
    Laboratory Beating of Pulp (PFI Mill Method)
    實驗室紙漿叩解法(PFI研磨機法) - 英文版

    Translated
    CNS 12515 - English Version
    Sintered Bronze Bearings (Self-lubricating)
    燒結青銅自潤軸承 - 英文版

    CNS 12516 - English Version
    Sintered Iron Base Bearings (Self-lubricating)
    燒結鐵基自潤軸承 - 英文版

    CNS 12866 - English Version
    Basic Environmental Testing Procedures Part 2 : Tests-Test Z/AM : Combined Cold/Low Air Pressure Tests
    環境試驗法(電氣、電子)-低溫/低氣壓複合試驗法 - 英文版

    CNS 12565 - English Version
    Basic Environmental Testing Procedures Part 2: Tests, Test Db: Damp Heat, Cycle (12+12-Hour Cycle)
    環境試驗方法(電氣、電子)-溫濕度循環(12+12小時循環)試驗方法 - 英文版

    CNS 12817 - English Version
    Basic Environmental Testing Procedures Part 2 : Tests, Test XA and Guidance : Immersion in Cleaning Solvents
    環境試驗法(電氣、電子)-耐溶劑性(浸漬)試驗法 - 英文版

    CNS 12715 - English Version
    Basic Environmental Testing Procedures Part 2: Tests, Test Eb: Bump
    環境試驗方法(電氣、電子)-碰撞試驗方法 - 英文版

    CNS 12716 - English Version
    Basic Environmental Testing Procedures - Part 2: Tests, Mounting of Components, Equipment and Articles for Dynamic Tests Including Shock (Ea), Bump (Eb), Vibration ( Fc and Fd ) and Steady - State Acceleration ( Ga ) and Guidance
    環境試驗方法(電氣、電子)-動態試驗(包括衝擊、碰撞、振動及定加速度)之零組件、設備安裝方法及指南 - 英文版

    CNS 12733 - English Version
    Method of Test for Book Bulk and Bulking Number of Printing Paper
    印刷紙之鬆度及鬆度值試驗法 - 英文版

    Translated
    CNS 12751 - English Version
    Method of Test for Water Absorption of Corrugating Medium
    瓦楞芯紙吸水率試驗法 - 英文版

    Translated
    CNS 12747 - English Version
    Base paper for continuous business forms
    電腦報表紙原紙 - 英文版

    CNS 12765 - English Version
    Method of test for the rate of linear change of refractory brick on heating
    耐火磚加熱線膨脹率試驗法 - 英文版

    CNS 13121 - English Version
    Method of Test for Beating Degree of Pulp
    紙漿之叩解度試驗法 - 英文版

    Translated
    CNS 12517 - English Version
    Sintered Aeronautical Bearings (Self-lubricating)
    航空用燒結自潤軸承 - 英文版

    CNS 13811 - English Version
    Numerical-Type Reflectors for Light Emitting Diodes
    發光二極體數字型反射套板 - 英文版

    CNS 13101 - English Version
    Method of corrodkote procedure corrosion testing for decorative electroplated coating
    表面處理用腐蝕泥試驗法 - 英文版

    CNS 13780 - English Version
    Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test
    自動控制用紅外發光二極體耐久性試驗法-連續通電試驗 - 英文版

    CNS 13781 - English Version
    Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
    自動控制用紅外發光二極體耐久性試驗法-預燒試驗(順向偏壓) - 英文版

    CNS 13782 - English Version
    Realiability Assured Infrared Emitting Diodes (IRED)(for Automation)
    自動控制用可靠度保證紅外發光二極體 - 英文版

    CNS 13806 - English Version
    Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes
    發光二極體磊晶片發光波長與亮度量測法 - 英文版

    CNS 13807 - English Version
    Methods of Test of Epoxy for Light Emitting Diodes
    發光二極體用環氧樹脂試驗法 - 英文版

    CNS 13808 - English Version
    Epitaxial Wafers for Light Emitting Diodes
    發光二極體磊晶片 - 英文版

    CNS 13656 - English Version
    Lot-Control Testing for Photodiode(for Communication)
    通信用光二極體之批品質控制測試 - 英文版

    CNS 13810 - English Version
    Lead Frames for Light Emitting Diodes
    發光二極體用支架 - 英文版

    CNS 13655 - English Version
    Reliability Testing for Photodiode(for Communication)
    通信用光二極體之可靠度測試 - 英文版


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