"GHz" CNS Standards Search Result |
CNS 14959
- English Version Limits for exposuring to time-varying electric, magnetic and electromagnetic fields (up to 300 GHz) 時變電場、磁場及電磁場曝露之限制值(300GHz以下) - 英文版 |
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CNS 15748-4
- English Version Integrated Circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method 積體電路-150 kHz 至1 GHz 電磁放射量測-第4 部:傳導放射量測-1Ω/150Ω直接耦合法積體電路-150 kHz 至1 GHz 電磁放射量測-第4 部:傳導放射量測-1Ω/150Ω直接耦合法 - 英文版 |
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CNS 15748-5
- English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method 積體電路-150 kHz 至1 GHz 電磁放射量測-第5 部:傳導放射量測-工作台法拉第箱體法 - 英文版 |
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CNS 15748-3
- English Version Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method 積體電路-150 kHz 至1 GHz 電磁放射量測-第3 部:輻射放射量測-表面掃描法 - 英文版 |
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CNS 15329-4
- English Version Information technology - Radio frequency identification device conformance test methods - Part 4: Test methods for air interface communications at 2.45 GHz 資訊技術-無線射頻識別裝置符合性測試方法-第4部:2‧45GHz空中介面通信之測試方法 - 英文版 |
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CNS 15748-6
- English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路-150 kHz 至1 GHz 電磁放射量測-第6 部:傳導放射量測-磁場探棒法 - 英文版 |
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CNS 15748-2
- English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method 積體電路- 150 kHz 至1 GHz 電磁放射量測-第2 部: 輻射放射量測- 橫向電磁波室與寬頻橫向電磁波室法 - 英文版 |
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CNS 15748-1
- English Version Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions 積體電路-150 kHz 至1 GHz 電磁放射量測-第1 部:一般條件及定義 - 英文版 |
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CNS 15811-4
- English Version Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第4 部: 射頻功率直接注入法 - 英文版 |
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CNS 15210-4
- English Version Information technology - Radio frequency identification for item management - Part 4: Parameters for air interface communications at 2.45GHz 資訊技術─品項管理之無線射頻識別─第4部:2.45GHz空中介面通信參數 - 英文版 |
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CNS 15617-2
- English Version Information technology − Real-time locating systems (RTLS) −Part 2: 2.4 GHz air interface protocol 資訊技術-即時定位系統(RTLS)-第2 部:2.4 GHz 空中介面協定 - 英文版 |
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CNS 13804
- English Version Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 - 英文版 |
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CNS 15811-5
- English Version Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第5 部: 工作台法拉第箱體法 - 英文版 |
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CNS 15811-1
- English Version Intergrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 1: General conditions and definitions 積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第1 部: 一般條件及定義 - 英文版 |
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CNS 15811-3
- English Version Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路-150 kHz 至1 GHz 電磁抗擾度量測-第3 部:大電流注入法 - 英文版 |
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CNS 15811-2
- English Version Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路-150 kHz 至1 GHz 電磁抗擾度量測-第2 部:輻射抗擾度量測-橫向電磁波室與寬頻橫向電磁波室法 - 英文版 |
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CNS 15811-4
- English Version Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method 積體電路-150 kHz至1 GHz電磁抗擾度量測-第4部:射頻功率直接注入法 - 英文版 |
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CNS 15811-2
- English Version Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method 積體電路-150 kHz至1 GHz電磁抗擾度量測-第2部:輻射抗擾度量測-橫向電磁波室與寬頻橫向電磁波室法 - 英文版 |
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CNS 15811-5
- English Version Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method 積體電路-150 kHz至1 GHz電磁抗擾度量測-第5部:工作台法拉第箱體法 - 英文版 |
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CNS 15748-6
- English Version Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method 積體電路-150 kHz至1 GHz電磁放射量測-第6部:傳導放射量測-磁場探棒法 - 英文版 |
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CNS 15811-1
- English Version Intergrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 1: General conditions and definitions 積體電路-150 kHz至1 GHz電磁抗擾度量測-第1部:一般條件及定義 - 英文版 |
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CNS 15811-3
- English Version Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method 積體電路-150 kHz至1 GHz電磁抗擾度量測-第3部:大電流注入法 - 英文版 |
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CNS 13804
- English Version Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 - 英文版 |
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