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    2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days .
         
    CNS 12865-4 - English Version
    Method of Test for Digital Microelectronics ( High Level Input Current )
    數位微電子檢驗法(高位準輸入電流) - 英文版

    CNS 12865-10 - English Version
    Method of Test for Digital Microelectronics (Functional Testing)
    數位微電子檢驗法(功能測試) - 英文版

    CNS 12865-7 - English Version
    Method of Test for Digital Microelectronics ( Drive Source, Dynamic )
    數位微電子檢驗法(驅動源,動態) - 英文版

    CNS 12865-8 - English Version
    Method of Test for Digital Microelectronics ( Load Condition )
    數位微電子檢驗法(負載條件) - 英文版

    CNS 12865-2 - English Version
    Method of Test for Digital Microelectronics ( Low Level Output Voltage )
    數位微電子檢驗法(低位準輸出電壓) - 英文版

    CNS 12865-3 - English Version
    Method of Test for Digital Microelectronics ( Low Level Input Current )
    數位微電子檢驗法(低位準輸入電流) - 英文版

    CNS 12865-6 - English Version
    Method of Test for Digital Microelectronics ( Terminal Capacitance )
    數位微電子檢驗法(端子電容值) - 英文版

    CNS 12865-5 - English Version
    Method of Test for Digital Microelectronics ( Output Short Circuit Current )
    數位微電子檢驗法(輸出端短路電流) - 英文版

    CNS 12865-1 - English Version
    Method of Test for Digital Microelectronics ( High Level Output Voltage )
    數位微電子檢驗法(高位準輸出電壓) - 英文版

    CNS 12865-9 - English Version
    Method of Test for Digital Microelectronics ( Delay Measurements )
    數位微電子檢驗法(延遲量測) - 英文版

    CNS 13725 - English Version
    Method of Nondestructive Test for Microelectronic Wire Bonds
    微電子銲線之非破壞性拉力試驗法 - 英文版

    CNS 13724 - English Version
    Method of Test for Pull Strength of Microelectronic Wire Bonds
    微電子銲線拉力試驗法 - 英文版

    CNS 12865-11 - English Version
    Noise margin measurements for digital Microelectronic devices
    數位微電子量測法(雜訊邊限量測) - 英文版

    CNS 13725 - English Version
    Method of Nondestructive Test for Microelectronic Wire Bonds
    微電子銲線之非破壞性拉力試驗法 - 英文版

    CNS 12865-2 - English Version
    Method of Test for Digital Microelectronics ( Low Level Output Voltage )
    數位微電子檢驗法(低位準輸出電壓) - 英文版

    CNS 12865-3 - English Version
    Method of Test for Digital Microelectronics ( Low Level Input Current )
    數位微電子檢驗法(低位準輸入電流) - 英文版

    CNS 12865-4 - English Version
    Method of Test for Digital Microelectronics ( High Level Input Current )
    數位微電子檢驗法(高位準輸入電流) - 英文版

    CNS 12865-5 - English Version
    Method of Test for Digital Microelectronics ( Output Short Circuit Current )
    數位微電子檢驗法(輸出端短路電流) - 英文版

    CNS 12865-6 - English Version
    Method of Test for Digital Microelectronics ( Terminal Capacitance )
    數位微電子檢驗法(端子電容值) - 英文版

    CNS 12865-7 - English Version
    Method of Test for Digital Microelectronics ( Drive Source, Dynamic )
    數位微電子檢驗法(驅動源,動態) - 英文版

    CNS 12865-8 - English Version
    Method of Test for Digital Microelectronics ( Load Condition )
    數位微電子檢驗法(負載條件) - 英文版

    CNS 12865-9 - English Version
    Method of Test for Digital Microelectronics ( Delay Measurements )
    數位微電子檢驗法(延遲量測) - 英文版

    CNS 12865-10 - English Version
    Method of Test for Digital Microelectronics (Functional Testing)
    數位微電子檢驗法(功能測試) - 英文版

    CNS 13724 - English Version
    Method of Test for Pull Strength of Microelectronic Wire Bonds
    微電子銲線拉力試驗法 - 英文版

    CNS 12865-1 - English Version
    Method of Test for Digital Microelectronics ( High Level Output Voltage )
    數位微電子檢驗法(高位準輸出電壓) - 英文版


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