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CNS 13802-5
- English Version Graphical Symbols for Diagrams (semiconductors and Electron Tubes) 電機工程製圖符號（半導體及電子管） - 英文版 |
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CNS 6127
- English Version General Rules for Reliability Assured Discrete semiconductor Devices 可靠度保證單件半導體裝置總則 - 英文版 |
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CNS 15377
- English Version Fine ceramics − Ultraviolet light source for testing semiconducting photocatalytic materials 精密陶瓷－紫外線光源用於半導體光觸媒材料測試 - 英文版 |
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CNS 11900
- English Version Fixed Ceramic Capacitors for Electronic Equipment (semiconductor) 電子設備用陶瓷固定電容器（半導體） - 英文版 |
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CNS 13623
- English Version Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） - 英文版 |
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CNS 15187-4
- English Version Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices 低壓熔線－第４部︰半導體裝置保護用熔線鏈之補充規定 - 英文版 |
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CNS 13805
- English Version Method of Measurement for Photoluminescence of Optoelectronic semiconductor Wafers 光電半導體晶圓之光激光譜量測法 - 英文版 |
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CNS 6137
- English Version Color Coding of Discrete semiconductor Devices 個別半導體元件之色碼 - 英文版 |
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CNS 15187-4-1
- English Version Low-voltage fuses - Part 4-1: Supplementary requirements for fuse-links for the protection of semiconductor devices - Sections I to III : Examples of types of standardized fuse-links 低壓熔線－第４－１部︰半導體裝置保護用熔線鏈之補充規定－第Ｉ章至第ＩＩＩ章︰經標準化之熔線鏈各種類型範例 - 英文版 |
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CNS 13805
- English Version Method of Measurement for Photoluminescence of Optoelectronic semiconductor Wafers 光電半導體晶圓之光激光譜量測法 - 英文版 |
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CNS 13623
- English Version Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） - 英文版 |
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CNS 11900
- English Version Fixed Ceramic Capacitors for Electronic Equipment (semiconductor) 電子設備用陶瓷固定電容器（半導體） - 英文版 |
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CNS 6137
- English Version Color Coding of Discrete semiconductor Devices 個別半導體元件之色碼 - 英文版 |
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CNS 6127
- English Version General Rules for Reliability Assured Discrete semiconductor Devices 可靠度保證單件半導體裝置總則 - 英文版 |
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