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    CNS 15748-4 - English Version
    Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
    積體電路-150 kHz 至1 GHz 電磁放射量測-第4 部:傳導放射量測-1Ω/150Ω直接耦合法積體電路-150 kHz 至1 GHz 電磁放射量測-第4 部:傳導放射量測-1Ω/150Ω直接耦合法 - 英文版

    CNS 15748-5 - English Version
    Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 5: Measurement of conducted emissions – Workbench Faraday Cage method
    積體電路-150 kHz 至1 GHz 電磁放射量測-第5 部:傳導放射量測-工作台法拉第箱體法 - 英文版

    CNS 15748-6 - English Version
    Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
    積體電路-150 kHz 至1 GHz 電磁放射量測-第6 部:傳導放射量測-磁場探棒法 - 英文版

    CNS 15811-4 - English Version
    Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
    積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第4 部: 射頻功率直接注入法 - 英文版

    CNS 15748-3 - English Version
    Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 3: Measurement of radiated emissions – Surface scan method
    積體電路-150 kHz 至1 GHz 電磁放射量測-第3 部:輻射放射量測-表面掃描法 - 英文版

    CNS 15811-5 - English Version
    Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method
    積體電路- 150 kHz 至1 GHz 電磁抗擾度量測- 第5 部: 工作台法拉第箱體法 - 英文版

    CNS 15748-2 - English Version
    Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 2: Measurement of radiated emissions − TEM cell and wideband TEM cell method
    積體電路- 150 kHz 至1 GHz 電磁放射量測-第2 部: 輻射放射量測- 橫向電磁波室與寬頻橫向電磁波室法 - 英文版

    CNS 15811-3 - English Version
    Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method
    積體電路-150 kHz 至1 GHz 電磁抗擾度量測-第3 部:大電流注入法 - 英文版

    CNS 15748-1 - English Version
    Integrated circuits − Measurement of electromagnetic emissions, 150 kHz to 1 GHz − Part 1: General conditions and definitions
    積體電路-150 kHz 至1 GHz 電磁放射量測-第1 部:一般條件及定義 - 英文版

    CNS 15811-2 - English Version
    Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method
    積體電路-150 kHz 至1 GHz 電磁抗擾度量測-第2 部:輻射抗擾度量測-橫向電磁波室與寬頻橫向電磁波室法 - 英文版

    CNS 15811-5 - English Version
    Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 5: Workbench Faraday cage method
    積體電路-150 kHz至1 GHz電磁抗擾度量測-第5部:工作台法拉第箱體法 - 英文版

    CNS 15811-4 - English Version
    Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 4: Direct RF power injection method
    積體電路-150 kHz至1 GHz電磁抗擾度量測-第4部:射頻功率直接注入法 - 英文版

    CNS 15811-3 - English Version
    Integrated circuits – Measurement of electromagnetic immunity − 150 kHz to 1 GHz – Part 3: Bulk current injection (BCI) method
    積體電路-150 kHz至1 GHz電磁抗擾度量測-第3部:大電流注入法 - 英文版

    CNS 15811-2 - English Version
    Integrated circuits − Measurement of electromagnetic immunity − 150 kHz to 1 GHz − Part 2: Measurement of radiated immunity − TEM cell and wideband TEM cell method
    積體電路-150 kHz至1 GHz電磁抗擾度量測-第2部:輻射抗擾度量測-橫向電磁波室與寬頻橫向電磁波室法 - 英文版

    CNS 15748-6 - English Version
    Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
    積體電路-150 kHz至1 GHz電磁放射量測-第6部:傳導放射量測-磁場探棒法 - 英文版


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