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    SJ/T 10754-1996 Test method for gold, silver and their alloy brazing for electron device. Test method for cleanness

    China Electronics - SJ Standards

    SJ/T 10794-1996 Designation method for glass in electronic techniques

    China Electronics - SJ Standards

    SJ/T 10755-1996 Test method for gold, silver and their alloy brazing for electron device. Test method for spatter

    China Electronics - SJ Standards

    SJ/T 10767-1996 Detail specification of circular connectors for radio and associated sound equipment. YS2 type circular connectors

    China Electronics - SJ Standards

    SJ/T 11030-1996 Analytical methods for gold copper and gold nickel brazing for electron device Determination of lead by dithizone spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10884-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10131 ECL dual D-type master-slave flip-flops (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10940-1996 Determination of Chromium oxide (Cr2O3) in color picture tube glass

    China Electronics - SJ Standards

    SJ/T 10908-1996 Determination of alumina (Al2O3) and zinc oxidein (ZnO) in electronic glass by EDTA complexicretric titration

    China Electronics - SJ Standards

    SJ/T 11008-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11235CP line and field sweep circuits

    China Electronics - SJ Standards

    SJ/T 11015-1996 Analytical methods for pure silver brazing for electron device Determination of iron by O-phenanthroline Spectrophotometry

    China Electronics - SJ Standards

    SJ/T 11070-1996 Detailed specifications for electronic components - CH11 fixed polyester-polypropylene film dielectric metal foil DC capacitors - Assessment level E (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10847-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10111 ECL dual 3-input NOR gate (3-output) (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10797-1996 Symbols and other markings on hearing aids and related equipment

    China Electronics - SJ Standards

    SJ/T 10732-1996 Type designation system for electronic tubes

    China Electronics - SJ Standards

    SJ/T 10971-1996 Detailed specifications for electronic components - 3DD204 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10790-1996 Detailed specifications for electronic components - 3CG21B and 3CG21C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10975-1996 Detailed specifications for electronic components - 3CG1825 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11056-1996 Detailed specifications for electronic components - 4CS1191 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10961-1996 Detailed specifications for electronic components - 3CG778 silicon PNP ambient-rated transistors for high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10960-1996 Detailed specifications for electronic components - 3CG844 silicon PNP ambient-rated transistors for high frequency amplification

    China Electronics - SJ Standards

    SJ/T 11041-1996 Test method for impact resistance strength of electronic glass

    China Electronics - SJ Standards

    SJ/T 10751-1996 Detailed specifications for CJ40 fixed metalized paper dielectric DC capacitors

    China Electronics - SJ Standards

    SJ/T 11093-1996 Series of turning numbers for variable vacuum capacitors

    China Electronics - SJ Standards

    SJ/T 10999-1996 Detail specification for electronic components. Type CD30 fixed aluminium electrolyte capacitors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11076-1996 Cores for inductors and transformers for telecommunications. Part 2: Guides for the drafting of performance specifications

    China Electronics - SJ Standards

    SJ/T 10769-1996 Detail specification of circular connectors for radio and associated sound equipment. YL type circular connectors

    China Electronics - SJ Standards

    SJ/T 10896-1996 Determination of ZnO PbO and Sb2O3 in electronic glass by atomic absorption

    China Electronics - SJ Standards

    SJ/T 10787-1996 Detail specification for electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL12 Assessment level E

    China Electronics - SJ Standards

    SJ/T 10893-1996 The general rules for chemical analysis of electronic glass

    China Electronics - SJ Standards

    SJ/T 11043-1996 Test method for high frequency dielectric losses and dielectric constant of electronic glass

    China Electronics - SJ Standards

    SJ/T 10955-1996 Detailed specifications for electronic components - 3DG107 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10951-1996 Detailed specifications for electronic components - 2CZ33 ambient-rated silicon rectifier diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11021-1996 Analytical methods for silver copper brazing for electron device Determination of Pb, Bi, Zn, Cd, Fe, Mg, Al, Sn and Sb by spectrochemical analysis

    China Electronics - SJ Standards

    SJ/T 10836-1996 Detailed specifications for electronic components - 3DK107A and 3DK107B bipolar switching transistors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11019-1996 Analytical methods for pure silver brazing for electron device Determination of Pb, Bi, Zn, Cd, Fe, Mg, Al, Sn and Sb by spectrochemical analysis

    China Electronics - SJ Standards

    SJ/T 10901-1996 Determination of manganese dioxide in electronic glass by the potassium periodate oxidation method

    China Electronics - SJ Standards

    SJ/T 10838-1996 Detailed specifications for electronic components - 2CZ201, 2CZ202 and 2CZ203 switching rectifier diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10860-1996 Test method for surface reflectivity of chromium film on chrome blanks

    China Electronics - SJ Standards

    SJ/T 10862-1996 Measurement of the performance characteristics of hearing aids for quality inspection for delivery purposes

    China Electronics - SJ Standards

    SJ/T 11105-1996 Metallic coatings. Test methods for electrodeposited gold and gold alloy coatings. Part 1: Determination of coating thickness

    China Electronics - SJ Standards

    SJ/T 10837-1996 Detailed specifications for electronic components -3DG131A, 3DG131B and 3DG131C ambient-rated bipolar transistors for high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10859-1996 Test method for chromium film and photoresist thickness of chrome blanks

    China Electronics - SJ Standards

    SJ/T 10861-1996 Test method for optical density of chrome blanks

    China Electronics - SJ Standards

    SJ/T 10772-1996 Detailed specifications for electronic components - 3DG201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10770-1996 Detailed specifications for electronic components - 3DG130A-3DG130D ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10760-1996 Designation of name and model of structure ceramic materials used in electronic components

    China Electronics - SJ Standards

    SJ/T 10764-1996 Offices machines and printing machines used for information processing -- Spools of printing ribbons

    China Electronics - SJ Standards

    SJ/T 10745-1996 Mechanical and climatic test methods for semiconductor integrated circuits

    China Electronics - SJ Standards

    SJ/T 10781-1996 Detailed specifications for electronic components - 37SX101Y22-DC01 color picture tubes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10833-1996 Detailed specifications for electronic components - 3DG80 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10929-1996 Potassium silicate solution for use in electronic industry. The methods of determination for weighty metals

    China Electronics - SJ Standards

    SJ/T 10959-1996 Detailed specifications for electronic components - 3CT320 case-rated avalanche triode thyristors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10744-1996 Special technical terms in production of tungsten and molybdenum wires

    China Electronics - SJ Standards

    SJ/T 10756-1996 The rule of type designation for circular connectors for radio and associated sound equipment

    China Electronics - SJ Standards

    SJ/T 10949-1996 Detailed specifications for electronic components - 2CZ321 ambient-rated silicon rectifier diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10863-1996 Detailed specifications for electronic components - 47SX101Y22-DC05 color picture tubes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10775-1996 (Chinese Industry Standard)

    China Electronics - SJ Standards

    SJ/T 10748-1996 Detailed specifications for CJ10 fixed metalized paper dielectric DC capacitors

    China Electronics - SJ Standards

    SJ/T 10773-1996 Detailed specifications for electronic components - 3DK106A and 3DK106B bipolar switching transistors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10976-1996 Detailed specifications for electronic components - QL62 silicon single phase bridge rectifiers (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10958-1996 Detailed specifications for electronic components - 3CT320 case-rated reverse blocking triode thyristors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10925-1996 Potassium silicate solution for use in electronic industry. The methods of calculation for concentration and modulus

    China Electronics - SJ Standards

    SJ/T 11109-1996 Metallic coatings. Test methods for electrodeposited gold and gold alloy coatings. Part 5: Adhesion tests

    China Electronics - SJ Standards

    SJ/T 10926-1996 Potassium silicate solution for use in electronic industry. The methods of determination for iron

    China Electronics - SJ Standards

    SJ/T 11107-1996 Metallic coatings. Test methods for electrodeposited gold and gold alloy coatings. Part 3: Electrographic tests for porosity

    China Electronics - SJ Standards

    SJ/T 10771-1996 Detailed specifications for electronic components - 3DG111B (111C, 111E and 111F) ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10962-1996 Detailed specifications for electronic components - 3DA1514 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10791-1996 Detailed specifications for electronic components - 3CX2014A, 3CX201B and 3CX201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10957-1996 Detailed specifications for electronic components - 4CS103 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10765-1996 Generic specification of circular connectors for radio and associated sound equipment

    China Electronics - SJ Standards

    SJ/T 11113-1996 (Detailed specifications for low-power electronic components fixed non-wirewound resistors RJ13 type metal film fixed resistors Assessment level E (for certification))

    China Electronics - SJ Standards

    SJ/T 10848-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10117 ECL dual 2-channel 2-3-input AND-OR/OR-NAND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10858-1996 Test methods for surface flatness of glass substrate and chromium film

    China Electronics - SJ Standards

    SJ/T 10779-1996 Detailed specifications for electronic components - 2CN41 silicon fast-switching rectifier diodes - Assessment level E (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11018-1996 Analytical methods for pure silver brazing for electron device Determination of sulfur by combustion-iodimetry

    China Electronics - SJ Standards

    SJ/T 10950-1996 Detailed specifications for electronic components - 2CZ322 ambient-rated silicon rectifier diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10952-1996 Detailed specifications for electronic components - 2CZ323 ambient-rated silicon rectifier diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10931-1996 Detailed specifications for electronic components - Semiconductor microcomputer integrated circuits - Cμ6800 8-bit microprocessors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10923-1996 Potassium silicate solution for use in electronic industry. The methods of determination for total alkalinity

    China Electronics - SJ Standards

    SJ/T 10828-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0452 HTL dual peripheral positive NAND drivers

    China Electronics - SJ Standards

    SJ/T 10963-1996 Detailed specifications for electronic components - 3DG2271 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10834-1996 Detailed specifications for electronic components - CS111, CS112, CS113, CS114, CS115 and CS116 single-gate junction field-effect transistors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10835-1996 Detailed specifications for electronic components - 3DK105A and 3DK105B bipolar switching transistors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10864-1996 Measurement of the electrical properties of disk-seal tubes General

    China Electronics - SJ Standards

    SJ/T 10985-1996 Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes

    China Electronics - SJ Standards

    SJ/T 10988-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5132CP PIF amplifying circuits

    China Electronics - SJ Standards

    SJ/T 10987-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits

    China Electronics - SJ Standards

    SJ/T 10819-1996 Detailed specifications for electronic components - 35SX5B black and white picture tubes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10783-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7176CP SIF amplifying circuits (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10806-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for display drivers

    China Electronics - SJ Standards

    SJ/T 10766-1996 Detail specification of circular connectors for radio and associated sound equipment YS1 type circular connectors

    China Electronics - SJ Standards

    SJ/T 10973-1996 Detailed specifications for electronic components - 3DD200 bipolar transistors for silicon NPN low frequency amplification case (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11002-1996 Detail specification for Electronic component fixed polypropylene film dielectric metal foil D.C capacitors, type CBB111 Assessment level E

    China Electronics - SJ Standards

    SJ/T 10827-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0451 HTL dual peripheral positive AND drivers

    China Electronics - SJ Standards

    SJ/T 10829-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0453 HTL dual peripheral positive OR drivers

    China Electronics - SJ Standards

    SJ/T 11052-1996 Detailed specifications for electronic components - 3DG162 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10788-1996 Detailed specifications for electronic components - 3DG79 forward AGC low-noise transistor for high-frequency (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10841-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10102 ECL Quad 4-input NOR gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10849-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10121 ECL4-channel 3-3-3-3 input AND-OR/OR-NAND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10780-1996 Electronic components detail specification CY-0, 1, 2, 3mica dielectric capacitors Assessment level E

    China Electronics - SJ Standards


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