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    SJ/T 10799-1996 (Chinese Industry Standard)

    China Electronics - SJ Standards

    SJ/T 10814-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1027 TTL Triple 3-input positive-NAND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10759-1996 Dimensions of plugs for hearing aids

    China Electronics - SJ Standards

    SJ/T 10798-1996 (Chinese Industry Standard)

    China Electronics - SJ Standards

    SJ/T 11051-1996 Specifications for printed boards for TV broadcast receivers

    China Electronics - SJ Standards

    SJ/T 10763-1996 Basic size of the ribbon spools for drum line printers

    China Electronics - SJ Standards

    SJ/T 10816-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1040 TTL dual 4-input positive-NAND buffer (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10909-1996 Determination of K2O Na2O and Li2O in electronic glass by EDTA complexicretric titration fmission spectrcopy

    China Electronics - SJ Standards

    SJ/T 10809-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1002 TTL Quad 2-input positive-NAND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10784-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7609CP horizontal and vertical sweep circuits (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10768-1996 Detail specification of circular connectors for radio and associated sound equipment. YC type circular connectors

    China Electronics - SJ Standards

    SJ/T 10793-1996 Terms for glass in electronic techniques

    China Electronics - SJ Standards

    SJ/T 11044-1996 Detailed specifications for electronic components - UYF10 magnetic oxide cores - Assessment level A (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11080-1996 (Cathode ray tube guides gauge size)

    China Electronics - SJ Standards

    SJ/T 10785-1996 Detail specification for electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL10 Assessment level E

    China Electronics - SJ Standards

    SJ/T 11061-1996 Inspection procedures for electrical performance test equipments for solar cells

    China Electronics - SJ Standards

    SJ/T 11079-1996 General specification of mask alignment and exposure system

    China Electronics - SJ Standards

    SJ/T 10823-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2009 HTL triple 3-input positive-NAND gate

    China Electronics - SJ Standards

    SJ/T 10774-1996 (Chinese Industry Standard)

    China Electronics - SJ Standards

    SJ/T 10825-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2013 HTL Hex inverters

    China Electronics - SJ Standards

    SJ/T 10830-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0454 HTL dual peripheral positive NOR drivers

    China Electronics - SJ Standards

    SJ/T 10776-1996 Detail specification for electronic components Fixed ceramic dielectric capacitors type CT1 Assessment level E

    China Electronics - SJ Standards

    SJ/T 10869-1996 Measurement of the electrical properties of disk-seal tubes Measuring methods of the power gain

    China Electronics - SJ Standards

    SJ/T 10822-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2008 HTL dual 4-input positive-NAND gate

    China Electronics - SJ Standards

    SJ/T 10866-1996 Measurement of the electrical properties of disk-seal tubes Measuring methods of the frequency position

    China Electronics - SJ Standards

    SJ/T 11066-1996 Detailed specifications for electronic components - Electromechanical all-or-nothing relays of assessed quality - Test schedules 3 - JZC-21F DC electromagnetic relays (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10850-1996 Detail specification for electronic components Type CD10 fixed aluminium electrolyte capacitors

    China Electronics - SJ Standards

    SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits

    China Electronics - SJ Standards

    SJ/T 10851-1996 Detail specification for electronic components Type CD13 fixed aluminium electrolyte capacitors

    China Electronics - SJ Standards

    SJ/T 10856-1996 Detail specification for electronic components Type CA42 fixed tantalum capacitors with solid electrolyte Assessment level E

    China Electronics - SJ Standards

    SJ/T 10918-1996 Methods of measurement for camera tube yoke assemblies

    China Electronics - SJ Standards

    SJ/T 10782-1996 Detailed specifications for electronic components - 56SX101Y22-DC03 color picture tubes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11025-1996 Analytical methods for silver copper brazing for electron device Determination of lead by atomic absorption spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10910-1996 Visual-frequency coaxial connectors, Series SL10

    China Electronics - SJ Standards

    SJ/T 11016-1996 Analytical methods for pure silver brazing for electron device Determination of bismuth by strychnine-potassium iodide spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10899-1996 Determination of zirconia in electronic glass

    China Electronics - SJ Standards

    SJ/T 10935-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CF747 general dual operational amplifiers (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10897-1996 Determination of Co2O3 NiO and MnO2 in electronic glass by atomic absorption

    China Electronics - SJ Standards

    SJ/T 10878-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CW723 multi-terminal adjustable voltage regulators (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10892-1996 Silicon switching rectifier diode for type 2CN31D

    China Electronics - SJ Standards

    SJ/T 10903-1996 Determination of boron (B2O3) in electronic glass

    China Electronics - SJ Standards

    SJ/T 10914-1996 Performance requirements for meteorogical facsimile (analogue)

    China Electronics - SJ Standards

    SJ/T 10888-1996 Type designation system for magnetic heads of cassette tape recorders

    China Electronics - SJ Standards

    SJ/T 10742-1996 Tolerances for electronic ceramic parts

    China Electronics - SJ Standards

    SJ/T 11075-1996 Methods for chemical analysis of raw materials used in ferrites

    China Electronics - SJ Standards

    SJ/T 10734-1996 Letter symbols for semiconductor integrated circuits - Letter symbols for electrical parameters

    China Electronics - SJ Standards

    SJ/T 10981-1996 Detailed specifications for electronic components - 2CC24 and 2CC29 silicon tuning variable capacitance diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10924-1996 Potassium silicate solution for use in electronic industry. The methods of determination for silica content

    China Electronics - SJ Standards

    SJ/T 10932-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CC4013 CMOS dual D positive edge-triggered flip-flops (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10965-1996 Detailed specifications for electronic components - 3CD546 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10991-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CW574CS voltage regulators for electronic tuners

    China Electronics - SJ Standards

    SJ/T 11112-1996 Methods coatings. Test methods for electrodeposited silver and silver alloy coatings. Part 2: Adhesion tests

    China Electronics - SJ Standards

    SJ/T 10984-1996 Detail specification for electronic components Type CA fixed tantalum capactors with solid electrolyte

    China Electronics - SJ Standards

    SJ/T 10982-1996 Detailed specifications for electronic components -2CC25 and 2CC30 silicon band variable capacitance diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11095-1996 General specification for medical X-ray television equipment

    China Electronics - SJ Standards

    SJ/T 11114-1996 Type designation system for miniature driving-machines

    China Electronics - SJ Standards

    SJ/T 11014-1996 Analytical methods for pure silver brazing for electron device Determination of antimony by malachite green spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10964-1996 Detailed specifications for electronic components - 3DD401 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11027-1996 Analytical methods for silver copper brazing for electron device Determination of magnesium by atomic absorption spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10934-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CW7805 triple-terminal positive voltage regulators (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11033-1996 Test method for density of electronic glass by the sink -- float comparator

    China Electronics - SJ Standards

    SJ/T 11034-1996 Test method for d-c disruptive strength of electronic glass

    China Electronics - SJ Standards

    SJ/T 11090-1996 The properties and the test methods for antistatic silk-like fabric of synthetic filament in electronic industry

    China Electronics - SJ Standards

    SJ/T 10948-1996 Detailed specifications for electronic components - FG313052, FG314053, FG313054 and FG314055 semiconductor red light emitting diodes

    China Electronics - SJ Standards

    SJ/T 10946-1996 (Liquid soldering flux (rosin-based))

    China Electronics - SJ Standards

    SJ/T 10944-1996 Alundum powder for vacuum tubes

    China Electronics - SJ Standards

    SJ/T 10941-1996 Determination of chlorine (Cl)in color picture tube glass

    China Electronics - SJ Standards

    SJ/T 10938-1996 Method for measurement of light transmissivity (τ546) for color pictrure tube glass panel

    China Electronics - SJ Standards

    SJ/T 11023-1996 Analytical methods for silver copper brazing for electron device Determination of bismuth by atomic absorption spectrophotometry

    China Electronics - SJ Standards

    SJ/T 11082-1996 (Chinese Industry Standard)

    China Electronics - SJ Standards

    SJ/T 10843-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10105 ECL Triple 2, 3, 2-input OR/NOR gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories

    China Electronics - SJ Standards

    SJ/T 10824-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2010 HTL Quad 2-input positive-NAND gate

    China Electronics - SJ Standards

    SJ/T 10916-1996 Packaging of color picture tubes

    China Electronics - SJ Standards

    SJ/T 10853-1996 Detail specification for electronic components Type CD19 fixed aluminium electrolyte capacitors

    China Electronics - SJ Standards

    SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits

    China Electronics - SJ Standards

    SJ/T 10902-1996 Determination of silica (SiO2) in electronic glass

    China Electronics - SJ Standards

    SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits

    China Electronics - SJ Standards

    SJ/T 10750-1996 Detailed specifications for CJ30 fixed metalized paper dielectric DC capacitors

    China Electronics - SJ Standards

    SJ/T 10889-1996 Variable ceramic vacuum capacitors of type CKTB 400/7.5/60

    China Electronics - SJ Standards

    SJ/T 10815-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1030 TTL8 input positive-NAND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10813-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1020 TTL dual 4-input positive-NAND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10873-1996 Detail specification for electronic components Fixed metallized polyethylene-terephthalate film dielectric DC capacitors Type CL2 Assessment level E

    China Electronics - SJ Standards

    SJ/T 10911-1996 Visual-frequency coaxial connectors, Series SL12

    China Electronics - SJ Standards

    SJ/T 10882-1996 Semiconductor integrated circuits - General principles of measuring methods for linear amplifiers

    China Electronics - SJ Standards

    SJ/T 11068-1996 Fixed capacitors for use in electronic equipment Part 4: Blank detail specification Aluminium electrolytic capacitors with non solid electrolyte Assessment Level E

    China Electronics - SJ Standards

    SJ/T 10885-1996 Detailed specifications for electronic components -3DA150B and 3DA150C bipolar transistors for high frequency amplification case (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10812-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1010 TTL Triple 3-input positive-NAND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11071-1996 Type N radio-frequency coaxial connectors

    China Electronics - SJ Standards

    SJ/T 10886-1996 Detailed specifications for electronic components - 3DD201 bipolar transistors for low frequency amplification case (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11083-1996 Detailed specifications for electronic components - FU-250F electronic tubes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10906-1996 Determination of baryta (BaO) in electronic glass

    China Electronics - SJ Standards

    SJ/T 10887-1996 Detailed specifications for electronic components -3DD102B bipolar transistors for low frequency amplification case (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11091-1996 General specification for lead-tinned for electronic components and devices

    China Electronics - SJ Standards

    SJ/T 11092-1996 Series of dimensions of terminals for vacuum capacitors

    China Electronics - SJ Standards

    SJ/T 10900-1996 Determination of arsenic (As2O3) in electronic glass

    China Electronics - SJ Standards

    SJ/T 10871-1996 Methods of measurement for electrical properties of disk-seal tubes - Methods of measurement for the three tone inter-modulation distortion

    China Electronics - SJ Standards

    SJ/T 10894-1996 Determination of Li2O Na2O and K2O in electronic glass by atomic absorption

    China Electronics - SJ Standards

    SJ/T 11089-1996 Letter symbols for discrete semiconductor components

    China Electronics - SJ Standards

    SJ/T 10870-1996 Measurement of the electrical properties of disk-seal tubes Measuring methods of AM-PM conversion coeffient

    China Electronics - SJ Standards


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