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    SJ/T 11640-2016 (Antioxidant dross reducing agent)

    China Electronics - SJ Standards

    SJ/T 11654-2016 (SSDs general specification)

    China Electronics - SJ Standards

    SJ/T 11630-2016 (Solar-wafer geometry test method)

    China Electronics - SJ Standards

    TB/T 2657-2016 (JZSJC AC filament changeover relay)

    China Railway & Train - SJ Standards

    SJ/T 3328.6-2016 (Electronic products with high purity quartz sand Part 6 Determination of copper)

    China Electronics - SJ Standards

    SJ/T 11104-2016 (Gold plating layer specification)

    China Electronics - SJ Standards

    SJ/T 11551-2015 (High density interconnect resin coated copper foil for printed circuits)

    China Electronics - SJ Standards

    SJ/T 11538-2015 (General specification thermal print head)

    China Electronics - SJ Standards

    SJ/T 11407.3.2-2015 Content protection specifications for digital interface - Part 3-2: Test specification for DTV-CI content protection system

    China Electronics - SJ Standards

    SJ/T 11343-2015 (General specification for digital TV LCD display)

    China Electronics - SJ Standards

    SJ/T 11407.3.1-2015 (Digital content protection system Interface Specification - Part 3-1: DTV-CI content protection system technical specifications)

    China Electronics - SJ Standards

    SJ/T 11544-2015 (Digital TV rear projection display optical engine technical requirements and methods of measurement)

    China Electronics - SJ Standards

    SJ/T 11339-2015 (General specification for digital television plasma display)

    China Electronics - SJ Standards

    SJ/T 2658.10-2015 Measuring method for semiconductor infrared-emitting diode - Part 10: Modulation bandwidth

    China Electronics - SJ Standards

    SJ/T 2658.3-2015 Measuring method for semiconductor infrared-emitting diode - Part 3: Reverse voltage and reverse current

    China Electronics - SJ Standards

    SJ/T 11561-2015 (Software component operating environment specification)

    China Electronics - SJ Standards

    SJ/T 11436-2015 (Fan coil air conditioning energy consumption monitoring system technical specifications)

    China Electronics - SJ Standards

    SJ/T 11563-2015 (Trusted Network software production process and environment)

    China Electronics - SJ Standards

    SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode - Part 12: Peak-emission wavelength and spectral radiant bandwidth

    China Electronics - SJ Standards

    SJ/T 2658.8-2015 Measuring method for semiconductor infrared-emitting diode - Part 8: Radiant intensity

    China Electronics - SJ Standards

    SJ/T 11564.4-2015 (IT Services Operation and Maintenance Part 4: Data Center Specification)

    China Electronics - SJ Standards

    SJ/T 11011-2015 (Electronics ICP-AES test method silver brazing filler metal impurity content of lead, bismuth, zinc, cadmium, iron, magnesium, aluminum, tin, antimony, phosphorus)

    China Electronics - SJ Standards

    SJ/T 11550-2015 (Crystalline silicon photovoltaic module with dip solder ribbon)

    China Electronics - SJ Standards

    SJ/T 2658.4-2015 Measuring method for semiconductor infrared-emitting diode - Part 4: Total capacitance

    China Electronics - SJ Standards

    SJ/T 11540-2015 (General specification for powered speakers)

    China Electronics - SJ Standards

    SJ/T 11549-2015 (Crystalline silicon photovoltaic module with no-clean flux)

    China Electronics - SJ Standards

    SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode - Part 1: General

    China Electronics - SJ Standards

    SJ/T 2089-2015 Type designation for electronic measuring instruments

    China Electronics - SJ Standards

    SJ/T 11030-2015 (Electronic devices with gilt bronze and gold-nickel brazing filler metal impurities of lead, zinc, phosphorus ICP-AES determination)

    China Electronics - SJ Standards

    SJ/T 11552-2015 (In Brewster angle incidence P polarized radiation of infrared absorption spectroscopy measurements interstitial oxygen in silicon)

    China Electronics - SJ Standards

    SJ/T 2658.7-2015 Measuring method for semiconductor infrared-emitting diode - Part 7: Radiant flux

    China Electronics - SJ Standards

    SJ/T 11029-2015 (Electronics determination of nickel with gold Nickel solder analysis EDTA volumetric method)

    China Electronics - SJ Standards

    SJ/T 11548.1-2015 (IT dimensional digital community social service management service management system specification - Part 1: General)

    China Electronics - SJ Standards

    SJ/T 11565.1-2015 (IT services consulting and design - Part 1: General requirements)

    China Electronics - SJ Standards

    SJ/T 2658.2-2015 Measuring method for semiconductor infrared-emitting diode - Part 2: Forward voltage

    China Electronics - SJ Standards

    SJ/T 2658.5-2015 Measuring method for semiconductor infrared-emitting diode - Part 5: Series connection resistance

    China Electronics - SJ Standards

    SJ/T 2658.11-2015 Measuring method for semiconductor infrared-emitting diode - Part 11: Response time

    China Electronics - SJ Standards

    SJ/T 11562-2015 (Collaborative software development platform technical specifications)

    China Electronics - SJ Standards

    SJ/T 2658.13-2015 Measuring method for semiconductor infrared-emitting diode - Part 13: Temperature coefficient for radiant power

    China Electronics - SJ Standards

    SJ/T 11554-2015 (Inductively coupled plasma emission spectrometry hydrofluoric acid content of metal elements)

    China Electronics - SJ Standards

    SJ/T 11437-2015 (IT removable storage portable digital audio and video players, general specification)

    China Electronics - SJ Standards

    SJ/T 11557-2015 General specification for low-voltage composite switch

    China Electronics - SJ Standards

    SJ/T 11346-2015 (Electronic projector measurement methods)

    China Electronics - SJ Standards

    SJ/T 2658.6-2015 Measuring method for semiconductor infrared-emitting diode - Part 6: Radiant power

    China Electronics - SJ Standards

    SJ/T 11545-2015 (Microdisplay projector AC high pressure mercury lamp General specification)

    China Electronics - SJ Standards

    SJ/T 2658.9-2015 Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle

    China Electronics - SJ Standards

    SJ/T 10414-2015 (The semiconductor device with solder)

    China Electronics - SJ Standards

    SJ/T 11439-2015 (IT PATTERN two-dimensional code reader engine general specification)

    China Electronics - SJ Standards

    SJ/T 11542-2015 (Stereoscopic projector technology requirements and test methods)

    China Electronics - SJ Standards

    SJ/T 10753-2015 (Electronics with gold, silver and alloy solder)

    China Electronics - SJ Standards

    SJ/T 11546-2015 (Tiled display wall technology requirements and methods of measurement)

    China Electronics - SJ Standards

    SJ/T 11558.5-2015 (LED drive power - Part 5: Test methods)

    China Electronics - SJ Standards

    SJ/T 11560-2015 (Audio amplifier energy efficiency limit value and energy efficiency rating for professional use Class D)

    China Electronics - SJ Standards

    SJ/T 11028-2015 (Determination of copper with gold and copper electronics solder analysis EDTA volumetric method)

    China Electronics - SJ Standards

    SJ/T 11537-2015 High performance computer-Cluster-Technical requirement for monitoring system

    China Electronics - SJ Standards

    SJ/T 11555-2015 (Determination of nitric acid metal elements by inductively coupled plasma mass spectrometry)

    China Electronics - SJ Standards

    SJ/T 11556-2015 (By atomic absorption spectrometry solvent nitric acid silver, gold, calcium, copper, iron, potassium and sodium content)

    China Electronics - SJ Standards

    SJ/T 11536.1-2015 High performance computer-Blade server - Part 1: Technical requirement for management module

    China Electronics - SJ Standards

    SJ/T 11438-2015 (IT commercial roll thermal paper common norms)

    China Electronics - SJ Standards

    SJ/T 11543-2015 (Front projector optical engine technical requirements and methods of measurement)

    China Electronics - SJ Standards

    SJ/T 11541-2015 (Dimensional television image quality test methods)

    China Electronics - SJ Standards

    SJ/T 11435-2015 (IT Services Management Technical Requirements)

    China Electronics - SJ Standards

    SJ/T 11539-2015 General specification for contact image sensor

    China Electronics - SJ Standards

    SJ/Z 2808-2015 (PCB assembly Thermal Design)

    China Electronics - SJ Standards

    SJ/T 10754-2015 (Electronics with gold, silver and alloy brazing methods cleanliness, sputtering Determination)

    China Electronics - SJ Standards

    SJ/T 11553-2015 (93% alumina ceramic vacuum electron)

    China Electronics - SJ Standards

    SJ/T 11499-2015 Test method for measuring electrical properties of monocrystalline silicon carbide

    China Electronics - SJ Standards

    SJ/T 10464-2015 Metallized polypropylene film for capacitors

    China Electronics - SJ Standards

    SJ/T 11378.7-2015 (Plasma display panels - Part 7: Digital TV with the reliability of the test method for plasma display)

    China Electronics - SJ Standards

    SJ/T 10465-2015 Metallized polyester film for capacitors

    China Electronics - SJ Standards

    SJ/T 11516-2015 Specification for thin film transistor (TFT) mask

    China Electronics - SJ Standards

    SJ/T 11378.6.1-2015 (Plasma display panels - Part 6-1: Digital TV color plasma display detailed specification)

    China Electronics - SJ Standards

    SJ/T 2216-2015 Technical specification for photodiode of silicon

    China Electronics - SJ Standards

    SJ/T 11532.3-2015 General specification of electronic label for dangerous chemical gas cylinder identification. Part 3:Special requirements for reader/writer

    China Electronics - SJ Standards

    SJ/T 11489-2015 Test method for measuring etch pit density (EPD) in low dislocation density indium phosphide wafers

    China Electronics - SJ Standards

    SJ/T 11490-2015 Test method for measuring etch pit density (EPD) in low dislocation density gallium arsenide wafers

    China Electronics - SJ Standards

    SJ/T 11529-2015 General specification for radio frequency identification system of garment product line

    China Electronics - SJ Standards

    SJ/T 11517-2015 Gases for electronic industry-Carbon monoxide

    China Electronics - SJ Standards

    SJ/T 11460.6.2-2015 Backlight unit for liquid crystal display. Part 6-2:Measuring methods of dynamic optical and optoelectrical parameters

    China Electronics - SJ Standards

    SJ/T 11488-2015 Test method for measuring resistivity, hall coefficient and determining hall mobility in semi-insulating GaAs single crystals

    China Electronics - SJ Standards

    SJ/T 11492-2015 Test methods for measurement of composition of gallium arsenide phosphide wafers by photoluminescence

    China Electronics - SJ Standards

    SJ/T 11526-2015 Information technology. SCSI object-based storage device commands

    China Electronics - SJ Standards

    SJ/T 11534-2015 Copper-clad PTFE woven glass fabric laminate for microwave circuit

    China Electronics - SJ Standards

    SJ/T 11531-2015 Wireless technical standards and test methods of read-write device for electronic label

    China Electronics - SJ Standards

    SJ/T 11532.2-2015 General technical requirements of electronic label for dangerous chemical gas cylinder identification. Part 2:Application technical specification

    China Electronics - SJ Standards

    SJ/T 11520.8.4-2015 (Coaxial communication cables - Part 8-4: 50-141 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications)

    China Electronics - SJ Standards

    SJ/T 11491-2015 Test methods for measurement of interstitial oxygen content in silicon by short baseline infrared absorption spectrometry

    China Electronics - SJ Standards

    SJ/T 11498-2015 Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry

    China Electronics - SJ Standards

    SJ/T 11520.8.2-2015 (Coaxial communication cables - Part 8-2: 50-047 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications)

    China Electronics - SJ Standards

    SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor

    China Electronics - SJ Standards

    SJ/T 11494-2015 Test methods for photoluminescence analysis of single crystal silicon for III-V impurities

    China Electronics - SJ Standards

    SJ/T 11530-2015 Information technology. General specification for swithching power adapter

    China Electronics - SJ Standards

    SJ/T 11504-2015 Test method for measuring surface quality of polished monocrystalline silicon carbide

    China Electronics - SJ Standards

    SJ/T 11496-2015 Determination of boron concentration in gallium arsenide by infrared absorption

    China Electronics - SJ Standards

    SJ/T 2215-2015 Measuring methods for semiconductor photocouplers

    China Electronics - SJ Standards

    SJ/T 11520.8.5-2015 (Coaxial communication cables - Part 8-5: 50-250 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications)

    China Electronics - SJ Standards

    SJ/T 11520.8.9-2015 (Coaxial communication cables - Part 8-9: 75-250 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications)

    China Electronics - SJ Standards

    SJ/T 11528-2015 Information technology. Mobile storage.General specification of memory cards

    China Electronics - SJ Standards

    SJ/T 11521.3-2015 Interactive platform for digital television receiving equipment. Part 3:System testing specification

    China Electronics - SJ Standards

    SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer

    China Electronics - SJ Standards


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