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  •  China "SJ" Standards List:
  • Standard  Code Standard English Title Standard Class Order
    JJG(SJ)12037-1991 (DF5990A speaker resonance frequency meter verification procedures)

    China Metrological - SJ Standards

    JJG(SJ)15020-1991 (XT-22-type comb frequency generator test procedures)

    China Metrological - SJ Standards

    JJG(SJ)03009-1991 (SQ-20-type sampling oscilloscope test procedures)

    China Metrological - SJ Standards

    JJG(SJ)04043-1991 (CTG-1 high-frequency C-V characteristics tester test procedures)

    China Metrological - SJ Standards

    JJG(SJ)05040-1991 (YY2511 digital DC low resistance meter testing procedures)

    China Metrological - SJ Standards

    JJG(SJ)05041-1991 (CJ2780 type with three errors sorter test procedures)

    China Metrological - SJ Standards

    JJG(SJ)05044-1991 (HP4272A Preset capacity meter testing procedures)

    China Metrological - SJ Standards

    JJG(SJ)05045-1991 (HP4273A Preset capacity meter testing procedures)

    China Metrological - SJ Standards

    JJG(SJ)05046-1991 (GR1687-type LCR digital bridge test procedures)

    China Metrological - SJ Standards

    JJG(SJ)07009-1991 Specification for verification of HP3577A model network analyzers

    China Metrological - SJ Standards

    JJG(SJ)12035-1991 (Model 2010 heterodyne analyzer test procedures)

    China Metrological - SJ Standards

    JJG(SJ)01006-1991 (PO20 timing of the receiver type and frequency calibration verification procedures)

    China Metrological - SJ Standards

    JJG(SJ)18007-1991 (Resistance vacuum gauge test procedures)

    China Metrological - SJ Standards

    JJG(SJ)15023-1991 (Universal pulse generator test procedures)

    China Metrological - SJ Standards

    JJG(SJ)01005-1991 (XW-7 microwave frequency stabilization control test procedures)

    China Metrological - SJ Standards

    JJG(SJ)03010-1991 (SG-1 type of second-tier high-sensitivity oscilloscope test procedures)

    China Metrological - SJ Standards

    JJG(SJ)04040-1991 (GH3181 op amp tester test procedures)

    China Metrological - SJ Standards

    JJG(SJ)12039-1991 (XJ5440 type waveform monitor oscilloscope test procedures)

    China Metrological - SJ Standards

    JJG(SJ)05037-1991 (HY2501 Precision resistor bridge test procedures)

    China Metrological - SJ Standards

    JJG(SJ)15016-1991 (1 ~ 2GHz microwave signal generator standard test procedures)

    China Metrological - SJ Standards

    JJG(SJ)12034-1991 (1617 bandpass filter test procedures)

    China Metrological - SJ Standards

    JJG(SJ)15015-1991 (1 ~ 2GHz microwave signal source verification procedures)

    China Metrological - SJ Standards

    JJG(SJ)04041-1991 (BJ3192-based integrated operational amplifier automatic tester test procedures)

    China Metrological - SJ Standards

    JJG(SJ)05042-1991 (CD-22-type bias Bridge test procedures)

    China Metrological - SJ Standards

    JJG(SJ)05043-1991 Specification for verification of CD-50 model universal bridges

    China Metrological - SJ Standards

    JJG(SJ)15014-1991 (5200A-type function generator test procedures)

    China Metrological - SJ Standards

    JJG(SJ)05047-1991 (CD9A Precision multimeter test procedures Bridge)

    China Metrological - SJ Standards

    JJG(SJ)15017-1991 (2 ~ 4GHz microwave signal source generic test procedures)

    China Metrological - SJ Standards

    SJ 3275-1990 Safety requirements for one-sided printed circuits boards made of paper

    China Electronics - SJ Standards

    SJ 3277-1990 Cartridge fuse-links for miniature fuses

    China Electronics - SJ Standards

    SJ 3272-1990 Safety requirements for resistors

    China Electronics - SJ Standards

    SJ 3274-1990 Safety requirements for single-phase A. C. power supply switches

    China Electronics - SJ Standards

    SJ/T 11101-1996 Tables for life testing Tables for best linear unbiased estimate (BLUE) (Normal distribution, log normal distribution)

    China Electronics - SJ Standards

    SJ/T 11102-1996 Tables for life testing Tables for good linear unblased estimate (BLUE) (Normal distribution, log normal distribution)

    China Electronics - SJ Standards

    SJ/T 11100-1996 Tables for life testing. Tables for good linear unbiased estiiniate (GLUE) (Extreme-value distribution, Weibull distribution)

    China Electronics - SJ Standards

    SJ/T 11099-1996 Tables for life testing Tables for best linear unbiased estimate (BLUE) (Extreme-value distribution, Weibull distribution)

    China Electronics - SJ Standards

    SJ/T 11103-1996 Tables for life testing Tables for Г(1+1/m)

    China Electronics - SJ Standards

    SJJ 21-1990 Standard for design of electric lighting in electronic industry

    China Electronics - SJ Standards

    SJ/T 3273-1990 Safety requirements for components and assemblies at high voltage

    China Electronics - SJ Standards

    SJ 3268-1989 Double side Aluminium-plated Iron strips and Nickel-Iron-Aluminium alloy strips

    China Electronics - SJ Standards

    SJ 3244.5-1989 Methods of measurement for compensation degree of Gallium arsenide and Indium phosphide materias

    China Electronics - SJ Standards

    SJ 3228.2-1989 General rules for methods of analysis for high purity arenaceous quartz

    China Electronics - SJ Standards

    SJ 3232.4-1989 (Low melting solder glass powder crystallization time measurement method)

    China Electronics - SJ Standards

    SJ 3246-1989 Methods for measuring Aluminium component in Aluminium-Gallium-Arsenic by phosphors method

    China Electronics - SJ Standards

    SJ 3228.4-1989 Determination of silicon oxide in high purity arenaceous quartz

    China Electronics - SJ Standards

    SJ 3253-1989 General requirements of inspection procedures for preparation of measuring equipment in electronic industry

    China Electronics - SJ Standards

    SJ 3237-1989 Method for determination of trace oxygen in electronic grade Argon--Argon ionization gas chromatography method

    China Electronics - SJ Standards

    SJ 3243-1989 Indium phosphide single-crystal bar and wafers

    China Electronics - SJ Standards

    SJ 3264-1989 General specification for electronic organ

    China Electronics - SJ Standards

    SJ 3244.4-1989 Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials--Electrochemical voltage capacitance method

    China Electronics - SJ Standards

    SJ 3233-1989 (Vacuum electronic devices electronic firearm frame glass rod)

    China Electronics - SJ Standards

    SJ 3244.2-1989 Methods of measurement for crystal lattice mismatch between substrate of Gallium arsenide and Indium phosphide and extended layer of heterojunction

    China Electronics - SJ Standards

    SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide

    China Electronics - SJ Standards

    SJ 3228.5-1989 Determination of Iron in high purity arenaceous quartz

    China Electronics - SJ Standards

    SJ 3236-1989 Method for determination of trace oxygen in electronic grade gases--Phosphor scintillating method

    China Electronics - SJ Standards

    SJ 3262-1989 General specification for packaging materials for use in electronic components

    China Electronics - SJ Standards

    SJ 3263-1989 (Broadcast receivers and associated equipment conducted immunity characteristic limit value)

    China Electronics - SJ Standards

    SJ 3254-1989 Methods for screen of samples of medium-low power transistors for measurements

    China Electronics - SJ Standards

    SJ 3239-1989 General requirement for gas chromatography analysis method

    China Electronics - SJ Standards

    SJ 3240-1989 Method for determination of trace Methane and hydrogen in electronic grade Argon--Argon ionization gas chromatography method

    China Electronics - SJ Standards

    SJ 3228.1-1989 Specification for high purty arenaceous quartz for use in electronic industry

    China Electronics - SJ Standards

    SJ 3250-1989 Grades of power and energy for gas laser devices

    China Electronics - SJ Standards

    SJ 3269-1989 Copper-plated Iron wire and Nickel-plated Iron wire for vacuum divices

    China Electronics - SJ Standards

    SJ 3232.3-1989 (Low melting solder glass powder flowability test methods)

    China Electronics - SJ Standards

    SJ 3249.1-1989 Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material

    China Electronics - SJ Standards

    SJ 3238-1989 Method for determination of trace Nitrogen in electronic grade Argon--Argon ionization gas chromatography method

    China Electronics - SJ Standards

    SJ 3225-1989 Fundamental performance requirements and classification for remote control system for use in colour television broadcast receivers

    China Electronics - SJ Standards

    SJ/Z 3229-1989 Guidelines for quality assurance system of color television sets

    China Electronics - SJ Standards

    SJ 3241-1989 Gallium arsenide single-crystal bar and wafer

    China Electronics - SJ Standards

    SJ 3228.10-1989 Determination of Lead in high purity arenaceous quartz

    China Electronics - SJ Standards

    SJ 3261-1989 Temperature fuses, Type RWH1

    China Electronics - SJ Standards

    SJ 3227-1989 Test methods for properties parameters of thermal tubes for use in electronic equipment

    China Electronics - SJ Standards

    SJ 3232.1-1989 (Low melting solder glass powder softening temperature of the test method)

    China Electronics - SJ Standards

    SJ 3248-1989 Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflection

    China Electronics - SJ Standards

    SJ 3242-1989 Gallium arsenide epitaxy wafers

    China Electronics - SJ Standards

    SJ 3245-1989 Methods for measuring dislocation of Indium phosphide single-crystal

    China Electronics - SJ Standards

    SJ 3265-1989 Methods of measurement for acoustic performance of electronic organ

    China Electronics - SJ Standards

    SJ 3230-1989 Test methods for natural cooling temperature in electronic equipment

    China Electronics - SJ Standards

    SJ 3235-1989 Ribbon getter made of Zirconium and Aluminium

    China Electronics - SJ Standards

    SJ 3232.2-1989 (Test Method for Low penetration welding residual stresses in the glass frit bonding)

    China Electronics - SJ Standards

    SJ 3244.1-1989 Methods of measurement for hall mobility and carrier concentration of Gallium arsenide and Indium phosphide

    China Electronics - SJ Standards

    SJ 3228.9-1989 Determination of Chlorine in high purity arenaceous quartz

    China Electronics - SJ Standards

    SJ 3231-1989 (Low penetration welding glass powder)

    China Electronics - SJ Standards

    SJ 3247-1989 Methods of measurement for extended-layer thickness of same-type Gallium arsenide by infra-red interference

    China Electronics - SJ Standards

    SJ 3267-1989 Ribbons of Nickel-coated Iron for use in vacuum tubes

    China Electronics - SJ Standards

    SJ 3266-1989 System for radio calling system

    China Electronics - SJ Standards

    SJ 3260-1989 Methods of measurement for electric properties of resonator with tuning fork and tablet

    China Electronics - SJ Standards

    SJ 3252-1989 (Popular class small tape recorder transport mechanism of total technical conditions)

    China Electronics - SJ Standards

    SJ 3249.2-1989 Methods of measurement for Carbon concentration of semi-insulation Gallicem arsenide single crystal by infra-red absorption

    China Electronics - SJ Standards

    SJ 3251-1989 General specification for antiairoraft gun radar antenna

    China Electronics - SJ Standards

    SJ 3226-1989 Test methods for ceramics-motal sealing strength against teusion

    China Electronics - SJ Standards

    SJ 3228.7-1989 Determination of Chromium in high purity arenaceous quartz

    China Electronics - SJ Standards

    SJ 3258-1989 General specification for popularized small recorders

    China Electronics - SJ Standards

    SJ 3228.6-1989 Determination of Copper in high purity arenaceous quartz

    China Electronics - SJ Standards

    SJ 3259-1989 General specification for resonator with tuning fork and tablet

    China Electronics - SJ Standards

    SJ 3249.4-1989 (Semi-insulating gallium arsenide infrared absorption in EL2 concentration test methods)

    China Electronics - SJ Standards

    SJ 3228.3-1989 Determination of loss on ignition in high purity arenaceous quartz

    China Electronics - SJ Standards

    SJ 3249.3-1989 Methods of measurement for chromium concentration in semi-insulation Gallium arsenide by infra-red absorption

    China Electronics - SJ Standards

    SJ 3228.8-1989 Determination of Alumiuium in high purity arenacous quartz

    China Electronics - SJ Standards

    SJ 3234-1989 Test method for dynamic relating to vacuum gas emission properties of electronic material

    China Electronics - SJ Standards


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