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    SJ 426-1973 Methods of measurement for noise figure for low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 332-1973 Generic specification for receiving tubes, high reliability, subminiature and finger-shaped

    China Electronics - SJ Standards

    SJ 421-1973 Methods of measurement for leakage current between last anode and each electrode of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 429-1973 Methods of measurement for frequency ranges of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 381-1973 Measurement of frequency temperature coefficient of reflex klystrons

    China Electronics - SJ Standards

    SJ 380-1973 Measurement of frequency stability of reflex klystrons

    China Electronics - SJ Standards

    SJ 434-1973 Method of measurement for power-voltage characteristics of O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 364-1973 Measurement of cathode current of reflex klystrons

    China Electronics - SJ Standards

    SJ 372-1973 Measurement of electronic tuning slope of reflex klystrons

    China Electronics - SJ Standards

    SJ 345-1973 General specification for power travelling wave tubes

    China Electronics - SJ Standards

    SJ 371-1973 Measurement of anti-overloading performance of reflex klystronss

    China Electronics - SJ Standards

    SJ 425-1973 Methods of measurement for power gain of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 419-1973 Measurement conditions for low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 439-1973 Method of measurement for maximum oscillation starting current of O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 375-1973 Measurement of of pulse modulation characteristic of reflex klystrons

    China Electronics - SJ Standards

    SJ 367-1973 Measurement of output power of reflex klystrons

    China Electronics - SJ Standards

    SJ 378-1973 Measurement of oscillation stability time of reflex klystron

    China Electronics - SJ Standards

    SJ 362-1973 Measurement conditions for reflex klystrons

    China Electronics - SJ Standards

    SJ 343-1973 Generic specification for gas-filled microwave switching tubes

    China Electronics - SJ Standards

    SJ 450-1973 Methods of measurement for anode dissipation power of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 441-1973 Method of measurement for operating frequency range of O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 437-1973 Method of measurement for frequency pulling figure of O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 368-1973 Measurement of power ripple ratio of reflex klystrons

    China Electronics - SJ Standards

    SJ 338-1973 General specification for high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 344-1973 General specification for low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 373-1973 Measurement of frequency pulling of reflex klystrons

    China Electronics - SJ Standards

    SJ 366-1973 Measurement of interelectrode leakage current of reflex klystrons

    China Electronics - SJ Standards

    SJ 423-1973 Methods of measurement for matching characteristic of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 432-1973 Method of measurement for cathode preheating time of O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 420-1973 Methods of measurement for voltages and currents on per-electrode of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 433-1973 Method of measurement for matching characteristics of O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 374-1973 Measurement of load characteristic of reflex klystrons

    China Electronics - SJ Standards

    SJ 430-1973 Measurement conditions for O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 376-1973 Measuremnt of electronic tuning hysteresis of reflex klystrons

    China Electronics - SJ Standards

    SJ 346-1973 General specification for O-Type backward wave tubes

    China Electronics - SJ Standards

    SJ 453-1973 Methods of measurement for pulse peak of rectifying current of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 445-1973 Methods of measurement for cathode pulse emission current and cathode pulse emission current on underheated condition of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 454-1973 Methods of measurement for peak voltage drop of tube, reverse peak voltage drop of tube and rectifying current of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 424-1973 Methods of measurement for cold loss of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 444-1973 Methods of measurement for anode current and anode current on underheated condition of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 435-1973 Method of measurement for frequency-voltage characteristics of O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 427-1973 Methods of measurement for dynamic ranges of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 438-1973 Method of measurement for spurious oscillations signal-to-noise ratio of O-type backwave tubes

    China Electronics - SJ Standards

    SJ 442-1973 Measurement conditions for high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 448-1973 Methods of measurement for static characteristic of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 428-1973 Methods of measurement for dynamic ranges of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 452-1973 Methods of measurement for reverse current of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 440-1973 Method of measurement for grid cut-off voltage of O-type backward-wave tubes

    China Electronics - SJ Standards

    SJ 449-1973 Methods of measurement for voltage with standing test for high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 422-1973 Methods of measuremenet for cathode prehcating time of low noise travelling wave tubes

    China Electronics - SJ Standards

    SJ 446-1973 Methods of measurement for tube voltage drop and tube voltage drop on underheated condition of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 451-1973 Methods of measurement for rectifying strength of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 443-1973 Method of measurement for cathode heating time of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 455-1973 Methods of measurement for static interelectrode capacitance of high-voltage rectifier tubes

    China Electronics - SJ Standards

    SJ 119-1973 (Chinese Industry Standard)

    China Electronics - SJ Standards

    SJ/T 10731-1996 Tolerances for regular clearance screw threads

    China Electronics - SJ Standards

    SJ 202-1981 General requirements and tests for printed boards

    China Electronics - SJ Standards

    SJ 152-1975 Type designation system for computer

    China Electronics - SJ Standards

    SJ 151-1980 Designation and marking of relays for use in electronic equipment

    China Electronics - SJ Standards

    SJ 99-1987 Laminations for transformers and chokes (G type)

    China Electronics - SJ Standards

    SJ 92-1986 Fuseboxes, Type BH

    China Electronics - SJ Standards

    SJ 26-1979 Method of life test for low power electronic tubes

    China Electronics - SJ Standards


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