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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 45721.1-2025 |
Semiconductor Devices - Stress Migration Test - Part 1: Copper Stress Migration Test {译} 半导体器件-应力迁移试验-第1部分：铜应力迁移试验 |
China National Standards Semiconductor Devices Stress |
 English PDF |
| GB/T 4937.4-2012 |
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) 半导体器件 机械和气候试验方法 第4部分：强加速稳态湿热试验（HAST） |
China National Standards Semiconductor Devices Stress |
English PDF |
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