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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 41765-2022 |
Test method for dislocation density of silicon carbide single crystal {译} 碳化硅单晶位错密度的测试方法 |
China National Standards Test method dislocation |
 English PDF |
| GB/T 8760-2020 |
Test method for dislocation density of monocrystal gallium arsenide 砷化镓单晶位错密度的测试方法 |
China National Standards Test method dislocation |
English PDF |
| GB/T 5252-2020 |
Test method for dislocation density of monocrystal germanium 锗单晶位错密度的测试方法 |
China National Standards Test method dislocation |
English PDF |
| GB/T 34481-2017 |
Test method for measuring etch pit density (EPD) in low dislocation density monocrystalline germanium slices 低位错密度锗单晶片腐蚀坑密度(EPD)的测量方法 |
China National Standards Test method dislocation |
English PDF |
| GB/T 33763-2017 |
Test method for dislocation density of sapphire single crystal 蓝宝石单晶位错密度测量方法 |
China National Standards Test method dislocation |
English PDF |
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