Standard Code | Standard Title | Standard Class | Order |
---|---|---|---|
SJ/T 11494-2015 |
Test methods for photoluminescence analysis of single crystal silicon for III-V impurities 硅单晶中iii-v族杂质的光致发光测试方法 |
China Electronics
Standards Test methods photoluminescence |
English PDF |
SJ/T 11492-2015 |
Test methods for measurement of composition of gallium arsenide phosphide wafers by photoluminescence 光致发光法测定磷镓砷晶片的组分 |
China Electronics
Standards Test methods photoluminescence |
English PDF |
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