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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ/T 10015-2013 |
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values 10kHz～200kHz音叉石英晶体元件的测试方法和标准值 |
China Electronics
Standards Crystal unit, quartz, |
 English PDF |
| SJ/T 11212-1999 |
Measurement of quartz crystal unit parameters. Part 6: Measurement of drive level dependence (DLD) 石英晶体元件参数的测量 第6部分：激励电平相关性（dld）的测量 |
China Electronics
Standards Crystal unit, quartz, |
English PDF |
| SJ/T 11211-1999 |
Measurement of quartz crystal unit parameters. Part 5: Method for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction 石英晶体元件参数的测量 第5部分：采用自动网络分析技术和误差校正确定等效电参数的方法 |
China Electronics
Standards Crystal unit, quartz, |
English PDF |
| SJ/T 11210-1999 |
Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz 石英晶体元件参数的测量 第4部分：频率达30mhz石英晶体元件负载谐振频率fl和负载谐振电阻rl的测量方法及其他导出参数的计算 |
China Electronics
Standards Crystal unit, quartz, |
English PDF |
| SJ/T 10707-1996 |
Quartz crystal units. A specification in the Quality Assessment System for Electronic Components. Part 2: Sectional specification. Capability approval. Section 1:Blank detail specification 石英晶体件－电子器件质量评定体系规范 第２部分：分规范－能力批准 第一篇 空白详细规范 |
China Electronics
Standards Crystal unit, quartz, |
English PDF |
| SJ/T 10708-1996 |
Quartz crystal units. A specification in the Quality Assessment System for Electronic Components. Part 3: Sectional specification. Qualification approval. Section 1:Blank detail specification 石英晶体件－电子器件质量评定体系规范 第３部分：分规范－鉴定批准 第一篇 空白详细规范 |
China Electronics
Standards Crystal unit, quartz, |
English PDF |
| SJ 52138.1-1995 |
Crystal unit, quartz, type JA 538. Detail specification ja538型石英晶体元件详细规范 |
China Electronics
Standards Crystal unit, quartz, |
English PDF |
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