Cart:
| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| HG/T 6093-2022 |
bipolar membrane {译} 双极膜 |
China Chemistry Industry
Standards bipolar |
 English PDF |
| QC/T 1136-2020 |
Environmental test requirements and test methods for insulated gate bipolar transistor (IGBT) modules for electric vehicles {译} 电动汽车用绝缘栅双极晶体管（IGBT）模块环境试验要求及试验方法 |
China Automobile Industry
Standards bipolar |
English PDF |
| YD/T 2618.3-2014 |
(40Gb/s optical transceiver module phase modulation requirements - Part 3: coherent reception and bipolar phase shift keying modulation) 40gb/s相位调制光收发合一模块技术条件 第3部分：相干接收和双极性相移键控调制 第3部分：相干接收和双极性相移键控调制 |
China Telecommunication
Standards bipolar |
English PDF |
| NB/T 42007-2013 |
bipolar plate for vanadium flow battery-test method 全钒液流电池用双极板 测试方法 |
China Energy industry
Standards bipolar |
English PDF |
| HG/T 3981-2007 |
bipolar membrane cells 复极式离子膜电解槽 |
China Chemical Industry
Standards bipolar |
English PDF |
| JJG(SJ)310007-2006 |
Speciation for verification of DC parameter testing system for isolated gate bipolar transistors |
China Metrological
Standards bipolar |
English PDF |
| JJG 310007-2006 |
Speciation for verification of DC parameter testing system for isolated gate bipolar transistors |
China Metrological
Standards bipolar |
English PDF |
| SJ 50033/146-2000 |
Semiconductor discrete devices. Detail specification for type 3DA601 C band silicon bipolar power transistor 半导体分立器件3da601型c波段硅双极型功率晶体管详细规范 |
China Electronics
Standards bipolar |
English PDF |
| SJ/T 10439-1993 |
Test methods for bipolar transister DC parameter testers 双极型晶体管直流参数测试仪测试方法 |
China Electronics
Standards bipolar |
English PDF |
| SJ/T 10438-1993 |
General specification for bipolar transister DC parameter testers 双极型晶体管直流参数测试仪通用技术条件 |
China Electronics
Standards bipolar |
English PDF |
| JJG(SJ)04033-1989 |
(BJ3123-type bipolar logic IC tester verification procedures) |
China Metrological
Standards bipolar |
English PDF |
| JJG(SJ)04019-1988 |
(BJ2902-type bipolar transistor H , V (subscript BE (sat)), V (subscript CE (sat)) standard instrument pilot test procedures) |
China Metrological
Standards bipolar |
English PDF |
| JJG(SJ)04018-1988 |
(BJ2901-type bipolar transistor reverse breakdown voltage of a standard instrument pilot test procedures) |
China Metrological
Standards bipolar |
English PDF |
| JJG(SJ)04017-1988 |
(BJ2900-type bipolar transistor cut-off current measurement standard instrument pilot test procedures) |
China Metrological
Standards bipolar |
English PDF |
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