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 China "GB/T 32565-2016" standard english version information:

1. China GB/T 32565-2016 Standard Chinese version, you can purchase directly online; After receive your payment, we will send the GB Standards PDF file to your Email within 24 Hr.
2. China GB/T 32565-2016 Standard English version is not ready-made,only after get your order, then we translate them, time usually need 3-5 days. Detail refere: "How to purchase the English version China GB Standards?"
Item Content
GB Standard  Code GB/T 32565-2016
GB Standard Class China National Standard
GB Standard English Title Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)
GB Standard Chinese Title 表面化学分析 俄歇电子能谱(AES)数据记录与报告的规范要求
Applicable Category China National-
Chinese Version Price $15 USD per 50 pages
English Translation Price About $15  per 1 page; Detail enquire us for
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Note The GB/T 32565-2016 standard english translation Prepayment unit $100 USD, is not mean this GB/T 32565-2016 standard english version price is $100 USD, it is only a basic unit of prepayment for translation, The actual translation fee and prepayment are depend on the amount of GB/T 32565-2016 standard Chinese words, We request 80% prepayment of the total translation fee.
For example, if the GB standard english price is $500, you need pay $400 prepayment, Four Quantities of the $100 prepayment unit.
  •  Relational standard of GB/T 32565-2016;    
  • Standard  Code GB Standard Title
  • GB/T 33502-2017
  • Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy(XPS)
  • GB/T 33498-2017
  • Surface chemical analysis—Characterization of nanostructured materials
  • GB/T 22571-2017
  • Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
  • GB/T 34326-2017
  • Surface chemical analysis—Depth profiling—Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • GB/T 20176-2006
  • Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials
  • GB/T 34174-2017
  • Surface chemical analysis—Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
  • GB/T 20175-2006
  • Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials
  • GB/T 32565-2016
  • Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)
  • GB/Z 32490-2016
  • Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds
  • GB/Z 32494-2016
  • Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
     
     

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