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 China "GB/T 33502-2017" standard english version information:

1. China GB/T 33502-2017 Standard Chinese version, you can purchase directly online; After receive your payment, we will send the GB Standards PDF file to your Email within 24 Hr.
2. China GB/T 33502-2017 Standard English version is not ready-made,only after get your order, then we translate them, time usually need 3-5 days. Detail refere: "How to purchase the English version China GB Standards?"
Item Content
GB Standard  Code GB/T 33502-2017
GB Standard Class China National Standard
GB Standard English Title Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy(XPS)
GB Standard Chinese Title 表面化学分析 X射线光电子能谱(XPS)数据记录与报告的规范要求
Applicable Category China National-
Chinese Version Price $15 USD per 50 pages
English Translation Price About $15  per 1 page; Detail enquire us for
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Note The GB/T 33502-2017 standard english translation Prepayment unit $100 USD, is not mean this GB/T 33502-2017 standard english version price is $100 USD, it is only a basic unit of prepayment for translation, The actual translation fee and prepayment are depend on the amount of GB/T 33502-2017 standard Chinese words, We request 80% prepayment of the total translation fee.
For example, if the GB standard english price is $500, you need pay $400 prepayment, Four Quantities of the $100 prepayment unit.
  •  Relational standard of GB/T 33502-2017;    
  • Standard  Code GB Standard Title
  • GB/T 33502-2017
  • Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy(XPS)
  • GB/T 33498-2017
  • Surface chemical analysis—Characterization of nanostructured materials
  • GB/T 34174-2017
  • Surface chemical analysis—Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
  • GB/T?20176-2006
  • Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials
  • GB/T?20175-2006
  • Surface chemical analysis-Sputter depth profiling-Optimization using layered systems as reference materials
  • GB/T 22571-2017
  • Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
  • GB/T 34326-2017
  • Surface chemical analysis—Depth profiling—Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • GB/Z 32494-2016
  • Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
  • GB/T 32565-2016
  • Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)
  • GB/Z 32490-2016
  • Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds

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