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 China 'GB/T 34504-2017 ' standard english version summary:

 

NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA

GB/T 34504-2017

Measurement method for surface metal contamination on sapphire polished substrate wafer
蓝宝石抛光衬底片表面残留金属元素测量方法

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Issued by:   The Standardization Administration of the People's Republic of China
 
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GB Standard Code GB/T 34504-2017
Standard Category China National Standards
GB Standard English Title Measurement method for surface metal contamination on sapphire polished substrate wafer
GB Standard Chinese Title 蓝宝石抛光衬底片表面残留金属元素测量方法
Chinese Version Price $15 USD per 50 pages
English Translation Fee About $15  per 1 page (1,000 words)
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Standard  Code GB Standard Title Cart
  • GB/T 34504-2017
  • Measurement method for surface metal contamination on sapphire polished substrate wafer
  • GB/T 34326-2017
  • Surface chemical analysis—Depth profiling—Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
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  • GB/T 22042-2008
  • Clothing - Electrostatic properties - Test method for measurement of surface resistivity
  • GB/T 18570.5-2005
  • Preparation of steel substrates before application of paints and related products-Tests for the assessment of surface cleanliness-Part 5:Measurement of chloride on surfaces prepared for painting(ion detection tube method)
  • JJF 1105-2003
  • Calibration specification for contact (stylus) instruments of surface roughness measurement by the profile method
  • SY/T 5370-1999
  • The method for measurement of surface tension and interfacial tension
  • SJ 2570-1985
  • Methods for the measurement of performances of surface acoustic wave (SAW) filters
  • JJG 301-1982
  • Verification Regulation of Contact (Stylus)Instruments for the Measurement of Surface Roughness by the Prvfile Method
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