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GB standards are the China national standards; Prefix code GB are Mandatory standards, GB/T are Recommended standards; All products or service must be compliance with GB standards; If you want to export products or services to huge Chinese market, need ensure they are meet the requirements of GB china national standards;  We provide Chinese GB standards and English version GB standards  Lookup, Translate, Download, Imported Commodity GB standards Testing and Compliance review services.
  •  China "Electron" GB Standards List:
  • Standard  Code GB Standard Title Standard Class Order
  • SJ/T 10697-1996
  • Electromechanical switches for use in Electronic equipment. Part 5: Sectional specification for pushbutton switches. Section 1. Blank detail specification Electron
    China Electronics Standards
  • SJ/T 11016-1996
  • Analytical methods for pure silver brazing for Electron device Determination of bismuth by strychnine-potassium iodide spectrophotometry Electron
    China Electronics Standards
  • SJ/T 10829-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CJ0453 HTL dual peripheral positive OR drivers Electron
    China Electronics Standards
  • SJ/T 10831-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits Electron
    China Electronics Standards
  • SJ/T 11113-1996
  • (Detailed specifications for low-power Electronic components fixed non-wirewound resistors RJ13 type metal film fixed resistors Assessment level E (for certification)) Electron
    China Electronics Standards
  • SJ/T 10927-1996
  • Potassium silicate solution for use in Electronic industry. The methods of determination for copper Electron
    China Electronics Standards
  • SJ/T 10849-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CE10121 ECL4-channel 3-3-3-3 input AND-OR/OR-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10850-1996
  • Detail specification for Electronic components Type CD10 fixed aluminium electrolyte capacitors Electron
    China Electronics Standards
  • SJ/T 10851-1996
  • Detail specification for Electronic components Type CD13 fixed aluminium electrolyte capacitors Electron
    China Electronics Standards
  • SJ/T 10856-1996
  • Detail specification for Electronic components Type CA42 fixed tantalum capacitors with solid electrolyte Assessment level E Electron
    China Electronics Standards
  • SJ/T 1635-1996
  • Basic identification colours and code indications for Electronics industrial pipelines Electron
    China Electronics Standards
  • SJ/T 11024-1996
  • Analytical methods for silver copper brazing for Electron device Determination of antimony by atomic absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 10989-1996
  • Detailed specifications for Electronic components - Semiconductor TV integrated circuits - CD5622CP PAL system chrominance signal processing circuits Electron
    China Electronics Standards
  • SJ/T 10835-1996
  • Detailed specifications for Electronic components - 3DK105A and 3DK105B bipolar switching transistors (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10979-1996
  • Detailed specifications for Electronic components - 2CC22 and 2CC27 silicon tuning variable capacitance diodes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10977-1996
  • Detailed specifications for Electronic components - 2CK111, 2CK112 and 2CK113 silicon switching diodes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10898-1996
  • Determination of iron oxide and titania in Electronic glass by photometric method Electron
    China Electronics Standards
  • SJ/T 10968-1996
  • Detailed specifications for Electronic components - 3DD205A silicon NPN case-rated transistors for high frequency amplification (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10903-1996
  • Determination of boron (B2O3) in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10905-1996
  • Determination of lead oxide in Electronic glass Electron
    China Electronics Standards
  • SJ 50033/110-1996
  • Semiconductor optoElectronic devices. Detail specification for type GR9413 infrared light emitting diode Electron
    China Electronics Standards
  • SJ/T 211.3-1996
  • Design documents for special equipment for Electronic industry. Part 3: Format of design documents Electron
    China Electronics Standards
  • SJ/T 10930-1996
  • Potassium silicate solution for use in Electronic industry -- The methods of determination for chloride Electron
    China Electronics Standards
  • SJ/T 10926-1996
  • Potassium silicate solution for use in Electronic industry. The methods of determination for iron Electron
    China Electronics Standards
  • SJ/T 10992-1996
  • Detailed specifications for Electronic components - 2CW412-473 voltage-regulating diodes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11084-1996
  • Detailed specifications for Electronic components - FU-100F electronic tubes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10789-1996
  • Detailed specifications for Electronic components - 2CL24, 2CL25, 2CL27 and 2CL29 glass passivated and encapsulated high voltage silicon stacks (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10791-1996
  • Detailed specifications for Electronic components - 3CX2014A, 3CX201B and 3CX201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11036-1996
  • Test method for average linear thermal expansion of Electronic glass Electron
    China Electronics Standards
  • SJ/T 10844-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CE10106 ECL Triple 4, 3, 3-input NOR gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10784-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CD7609CP horizontal and vertical sweep circuits (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10823-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CH2009 HTL triple 3-input positive-NAND gate Electron
    China Electronics Standards
  • SJ/T 10793-1996
  • Terms for glass in Electronic techniques Electron
    China Electronics Standards
  • SJ/T 10782-1996
  • Detailed specifications for Electronic components - 56SX101Y22-DC03 color picture tubes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11035-1996
  • Test method for chemical stability to resist water of Electronic glass Electron
    China Electronics Standards
  • SJ/T 11044-1996
  • Detailed specifications for Electronic components - UYF10 magnetic oxide cores - Assessment level A (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10742-1996
  • Tolerances for Electronic ceramic parts Electron
    China Electronics Standards
  • SJ/T 10822-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CH2008 HTL dual 4-input positive-NAND gate Electron
    China Electronics Standards
  • SJ 20609-1996
  • Electronic design interchange format Electron
    China Electronics Standards
  • SJ/T 10733-1996
  • Types and dimensions of single-hole mounting bushes of Electronic components Electron
    China Electronics Standards
  • SJ/T 10817-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1054 TTL4-channel 2-2-2-2 input AND OR INVENT gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10810-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1004 TTL Hex inverters (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10816-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1040 TTL dual 4-input positive-NAND buffer (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11025-1996
  • Analytical methods for silver copper brazing for Electron device Determination of lead by atomic absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 11048-1996
  • Detailed specifications for Electronic components - Varistors for surge suppression - MYG1 varistors for over-voltage protection - Assessment level E (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10776-1996
  • Detail specification for Electronic components Fixed ceramic dielectric capacitors type CT1 Assessment level E Electron
    China Electronics Standards
  • SJ/T 10694-1996
  • Test methods for electrostatic protection system in manufacturing Electronic products Electron
    China Electronics Standards
  • SJ/T 10964-1996
  • Detailed specifications for Electronic components - 3DD401 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10928-1996
  • Potassium silicate solution for use in Electronic industry. The methods of determination for nickel Electron
    China Electronics Standards
  • SJ/T 10948-1996
  • Detailed specifications for Electronic components - FG313052, FG314053, FG313054 and FG314055 semiconductor red light emitting diodes Electron
    China Electronics Standards
  • SJ/T 10987-1996
  • Detailed specifications for Electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits Electron
    China Electronics Standards
  • SJ/T 10965-1996
  • Detailed specifications for Electronic components - 3CD546 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10973-1996
  • Detailed specifications for Electronic components - 3DD200 bipolar transistors for silicon NPN low frequency amplification case (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10981-1996
  • Detailed specifications for Electronic components - 2CC24 and 2CC29 silicon tuning variable capacitance diodes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10986-1996
  • Detailed specifications for Electronic components - Semiconductor TV integrated circuits - CD5250CP SIF amplifiers Electron
    China Electronics Standards
  • SJ/T 11034-1996
  • Test method for d-c disruptive strength of Electronic glass Electron
    China Electronics Standards
  • SJ/T 211.1-1996
  • Design documents for special equipment for Electronic industry. Part 1: Completeness of design documents Electron
    China Electronics Standards
  • SJ/T 11028-1996
  • Analytical methods for gold copper brazing for Electron device Determination of copper by EDTA volumetry Electron
    China Electronics Standards
  • SJ/T 10998-1996
  • Detail specification for Electronic component Fixed polypropylene film dielectric metal foil D.C capacitors, type CBB13 Assessment level E Electron
    China Electronics Standards
  • SJ/T 11083-1996
  • Detailed specifications for Electronic components - FU-250F electronic tubes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11027-1996
  • Analytical methods for silver copper brazing for Electron device Determination of magnesium by atomic absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 11002-1996
  • Detail specification for Electronic component fixed polypropylene film dielectric metal foil D.C capacitors, type CBB111 Assessment level E Electron
    China Electronics Standards
  • SJ/T 11026-1996
  • Analytical methods for silver copper brazing for Electron device Determination of iron, cadmium and zinc by atomic absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 10932-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CC4013 CMOS dual D positive edge-triggered flip-flops (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11010-1996
  • Detailed specifications for Electronic components - Semiconductor TV integrated circuits - CD1124ACP SIF amplifying circuits Electron
    China Electronics Standards
  • SJ/T 11011-1996
  • Analytical methods for pure silver brazing for Electron device. Determination of lead by dithizone spectrophotometry Electron
    China Electronics Standards
  • SJ/T 10984-1996
  • Detail specification for Electronic components Type CA fixed tantalum capactors with solid electrolyte Electron
    China Electronics Standards
  • SJ/T 10830-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CJ0454 HTL dual peripheral positive NOR drivers Electron
    China Electronics Standards
  • SJ/T 10853-1996
  • Detail specification for Electronic components Type CD19 fixed aluminium electrolyte capacitors Electron
    China Electronics Standards
  • SJ/T 10813-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1020 TTL dual 4-input positive-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10814-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1027 TTL Triple 3-input positive-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10815-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1030 TTL8 input positive-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10824-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CH2010 HTL Quad 2-input positive-NAND gate Electron
    China Electronics Standards
  • SJ/T 10825-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CH2013 HTL Hex inverters Electron
    China Electronics Standards
  • SJ/T 37-1996
  • Model-drafting and designating methods of special equipment for Electronics industry Electron
    China Electronics Standards
  • SJ/T 10826-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CJ0450 HTL dual peripheral positive AND drivers Electron
    China Electronics Standards
  • SJ/T 10845-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CE10109 ECL dual 4, 5-input OR/NOR gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10897-1996
  • Determination of Co2O3 NiO and MnO2 in Electronic glass by atomic absorption Electron
    China Electronics Standards
  • SJ/T 10902-1996
  • Determination of silica (SiO2) in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10909-1996
  • Determination of K2O Na2O and Li2O in Electronic glass by EDTA complexicretric titration fmission spectrcopy Electron
    China Electronics Standards
  • SJ/T 11087-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CD7698CP horizontal and vertical sweep and chrominance processing circuits Electron
    China Electronics Standards
  • SJ/T 10785-1996
  • Detail specification for Electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL10 Assessment level E Electron
    China Electronics Standards
  • SJ/T 10786-1996
  • Detail specification for Electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL11 Assessment level E Electron
    China Electronics Standards
  • SJ/T 10843-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CE10105 ECL Triple 2, 3, 2-input OR/NOR gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11091-1996
  • General specification for lead-tinned for Electronic components and devices Electron
    China Electronics Standards
  • SJ/T 11040-1996
  • Test method for viscosity of Electronic glass while high temperature Electron
    China Electronics Standards
  • SJ/T 11014-1996
  • Analytical methods for pure silver brazing for Electron device Determination of antimony by malachite green spectrophotometry Electron
    China Electronics Standards
  • SJ/T 11042-1996
  • Test method for temperature (Tk-100) while volume resistivity of Electronic glass is 100MΩ·cm Electron
    China Electronics Standards
  • SJ/T 11033-1996
  • Test method for density of Electronic glass by the sink -- float comparator Electron
    China Electronics Standards
  • SJ/T 11017-1996
  • Analytical methods for pure silver brazing for Electron device Determination of phosphorus by phosphorimetry Electron
    China Electronics Standards
  • SJ/T 11029-1996
  • Analytical methods for gold nickel brazing for Electron device Determination of copper by EDTA volumetry Electron
    China Electronics Standards
  • SJ/T 10809-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1002 TTL Quad 2-input positive-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10812-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1010 TTL Triple 3-input positive-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ 50033/111-1996
  • Semiconductor optoElectronic devices. Detail specification for type GT16 Si.NPN phototransistor Electron
    China Electronics Standards
  • SJ/T 10906-1996
  • Determination of baryta (BaO) in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10924-1996
  • Potassium silicate solution for use in Electronic industry. The methods of determination for silica content Electron
    China Electronics Standards
  • SJ/T 11054-1996
  • Detailed specifications for Electronic components - 3DG140 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10899-1996
  • Determination of zirconia in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10895-1996
  • Determination of CaO SrO and MgO in Electronic glass by atomic absorption Electron
    China Electronics Standards
  • SJ/T 10894-1996
  • Determination of Li2O Na2O and K2O in Electronic glass by atomic absorption Electron
    China Electronics Standards

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