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GB standards are the China national standards; Prefix code GB are Mandatory standards, GB/T are Recommended standards; All products or service must be compliance with GB standards; If you want to export products or services to huge Chinese market, need ensure they are meet the requirements of GB china national standards;  We provide Chinese GB standards and English version GB standards  Lookup, Translate, Download, Imported Commodity GB standards Testing and Compliance review services.
  •  China "Electron" GB Standards List:
  • Standard  Code GB Standard Title Standard Class Order
  • SJ/T 10895-1996
  • Determination of CaO SrO and MgO in Electronic glass by atomic absorption Electron
    China Electronics Standards
  • SJ/T 10812-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1010 TTL Triple 3-input positive-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10885-1996
  • Detailed specifications for Electronic components -3DA150B and 3DA150C bipolar transistors for high frequency amplification case (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10965-1996
  • Detailed specifications for Electronic components - 3CD546 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10984-1996
  • Detail specification for Electronic components Type CA fixed tantalum capactors with solid electrolyte Electron
    China Electronics Standards
  • SJ/T 10982-1996
  • Detailed specifications for Electronic components -2CC25 and 2CC30 silicon band variable capacitance diodes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11083-1996
  • Detailed specifications for Electronic components - FU-250F electronic tubes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11068-1996
  • Fixed capacitors for use in Electronic equipment Part 4: Blank detail specification Aluminium electrolytic capacitors with non solid electrolyte Assessment Level E Electron
    China Electronics Standards
  • SJ/T 10964-1996
  • Detailed specifications for Electronic components - 3DD401 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10948-1996
  • Detailed specifications for Electronic components - FG313052, FG314053, FG313054 and FG314055 semiconductor red light emitting diodes Electron
    China Electronics Standards
  • SJ/T 10934-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CW7805 triple-terminal positive voltage regulators (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10932-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CC4013 CMOS dual D positive edge-triggered flip-flops (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10786-1996
  • Detail specification for Electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL11 Assessment level E Electron
    China Electronics Standards
  • SJ/T 10947-1996
  • Detailed specifications for Electronic components - FG341052 and FG343053 semiconductor green light emitting diodes Electron
    China Electronics Standards
  • SJ/T 10995-1996
  • Detail specification for Electronic components High Voltage ceramic capacitors type CT81 Assessment level E Electron
    China Electronics Standards
  • SJ/T 10909-1996
  • Determination of K2O Na2O and Li2O in Electronic glass by EDTA complexicretric titration fmission spectrcopy Electron
    China Electronics Standards
  • SJ/T 10970-1996
  • Detailed specifications for Electronic components - 3DG3077 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10903-1996
  • Determination of boron (B2O3) in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10978-1996
  • Detailed specifications for Electronic components - 2CC21 and 2CC26 silicon tuning variable capacitance diodes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10899-1996
  • Determination of zirconia in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10905-1996
  • Determination of lead oxide in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10793-1996
  • Terms for glass in Electronic techniques Electron
    China Electronics Standards
  • SJ/T 11091-1996
  • General specification for lead-tinned for Electronic components and devices Electron
    China Electronics Standards
  • SJ/T 11087-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CD7698CP horizontal and vertical sweep and chrominance processing circuits Electron
    China Electronics Standards
  • SJ/T 11078-1996
  • Detail specification for Electronic component Electronic tubes of type FC-306, FU-100F and Fu-250F Electron
    China Electronics Standards
  • SJ/T 10742-1996
  • Tolerances for Electronic ceramic parts Electron
    China Electronics Standards
  • SJ/T 10785-1996
  • Detail specification for Electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL10 Assessment level E Electron
    China Electronics Standards
  • SJ/T 10897-1996
  • Determination of Co2O3 NiO and MnO2 in Electronic glass by atomic absorption Electron
    China Electronics Standards
  • SJ/T 10808-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1000 TTL Quad 2-input positive-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11016-1996
  • Analytical methods for pure silver brazing for Electron device Determination of bismuth by strychnine-potassium iodide spectrophotometry Electron
    China Electronics Standards
  • SJ/T 10887-1996
  • Detailed specifications for Electronic components -3DD102B bipolar transistors for low frequency amplification case (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11025-1996
  • Analytical methods for silver copper brazing for Electron device Determination of lead by atomic absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 11090-1996
  • The properties and the test methods for antistatic silk-like fabric of synthetic filament in Electronic industry Electron
    China Electronics Standards
  • SJ/T 11088-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CD7680CP SIF amplifying circuits Electron
    China Electronics Standards
  • SJ/T 11014-1996
  • Analytical methods for pure silver brazing for Electron device Determination of antimony by malachite green spectrophotometry Electron
    China Electronics Standards
  • SJ/T 10994-1996
  • Detail specification for Electronic components High Voltage ceramic capacitors type CC81 Assessment level E Electron
    China Electronics Standards
  • SJ/T 11058-1996
  • Detailed specifications for Electronic components - 4CS1421 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11003-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CB14433 31/2-bit A/D converters (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11057-1996
  • Detailed specifications for Electronic components - 4CS142 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11023-1996
  • Analytical methods for silver copper brazing for Electron device Determination of bismuth by atomic absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 11027-1996
  • Analytical methods for silver copper brazing for Electron device Determination of magnesium by atomic absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 11033-1996
  • Test method for density of Electronic glass by the sink -- float comparator Electron
    China Electronics Standards
  • SJ/T 11034-1996
  • Test method for d-c disruptive strength of Electronic glass Electron
    China Electronics Standards
  • SJ/T 11000-1996
  • Detail specification for Electronic components. Type CD110 fixed aluminium electrolyte capacitors (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11059-1996
  • Detailed specifications for Electronic components - CS4220A single-gate N-channel junction type field-effect transistors (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10811-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CT1008 TTL Quad 2-input positive-NAND gate (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10924-1996
  • Potassium silicate solution for use in Electronic industry. The methods of determination for silica content Electron
    China Electronics Standards
  • SJ/T 10902-1996
  • Determination of silica (SiO2) in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10904-1996
  • Determination of fluorine in Electronic glass by specification electrode measurement Electron
    China Electronics Standards
  • SJ/T 10875-1996
  • Detail specification for Electronic components fixed capacitors, ceramic dielectric disc feed-through type CC52 Electron
    China Electronics Standards
  • SJ/T 10873-1996
  • Detail specification for Electronic components Fixed metallized polyethylene-terephthalate film dielectric DC capacitors Type CL2 Assessment level E Electron
    China Electronics Standards
  • SJ/T 10877-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CF741 operational amplifiers (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10876-1996
  • Detail specification for Electronic components fixed capacitors, ceramic dielectric disc feed-through type CT52 Electron
    China Electronics Standards
  • SJ/T 11020-1996
  • Analytical methods for silver copper brazing for Electron device Determination of copper by iodimetry Electron
    China Electronics Standards
  • SJ/T 11042-1996
  • Test method for temperature (Tk-100) while volume resistivity of Electronic glass is 100M惟路cm Electron
    China Electronics Standards
  • SJ/T 10883-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CDA7520 10-bit D/A converters (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11055-1996
  • Detailed specifications for Electronic components - 4CS119 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10894-1996
  • Determination of Li2O Na2O and K2O in Electronic glass by atomic absorption Electron
    China Electronics Standards
  • SJ/T 10753-1996
  • Gold, silver and their alloy brazing for Electron device Electron
    China Electronics Standards
  • SJ/T 11069-1996
  • Detail specification for Electronic components Fixed capacitors of ceramic dielectric, type CS1 Assessment level E Electron
    China Electronics Standards
  • SJ/T 10990-1996
  • Detailed specifications for Electronic components - Semiconductor TV integrated circuits - CD5612CP Picture chrominance signal processing circuits Electron
    China Electronics Standards
  • SJ/T 11013-1996
  • Analytical methods for pure silver brazing for Electron device Determination of cadmium by atomic absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 11040-1996
  • Test method for viscosity of Electronic glass while high temperature Electron
    China Electronics Standards
  • SJ/T 10996-1996
  • Detail specification for Electronic components. Type CD288 fixed aluminium electrolyte capacitors (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11017-1996
  • Analytical methods for pure silver brazing for Electron device Determination of phosphorus by phosphorimetry Electron
    China Electronics Standards
  • SJ/T 10906-1996
  • Determination of baryta (BaO) in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10900-1996
  • Determination of arsenic (As2O3) in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10933-1996
  • Detailed specifications for Electronic components - Semiconductor integrated circuits - CC4518 CMOS dual decimal system synchronous counters (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 10993-1996
  • Detailed specifications for Electronic components - 2CW380-411 voltage-regulating diodes (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11022-1996
  • Analytical methods for silver copper brazing for Electron device Determination of tin by C21H38BrN-absorption spectrophotometry Electron
    China Electronics Standards
  • SJ/T 11001-1996
  • Detail specification for Electronic components. Type CD291, CD292 and CD293 fixed aluminium electrolyte capacitors (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11047-1996
  • Detailed specifications for Electronic components - CB14 fixed polystyrene film dielectric metal foil DC capacitors - Assessment level E (Applicable for certification) Electron
    China Electronics Standards
  • SJ/T 11009-1996
  • Detailed specifications for Electronic components - Semiconductor TV integrated circuits - CD11215ACP PIF amplifying circuits Electron
    China Electronics Standards
  • QB/T 2263-1996
  • Electronic controller for room air conditioners Electron
    China Light Industry Standards
  • GB/T 2987-1996
  • Letter symbols of parameter for Electronic tubes Electron
    China National Standards
  • GB/T 16514-1996
  • Electromechanical switches for use in Electronic equipment--Part 5:Sectional specification for pushbutton switches Electron
    China National Standards
  • GB/T 16515-1996
  • Potentiometers for use in Electronic equipment--Part 5:Sectional specification--Single-turn rotary low-power wirewound and non-wirewound potentiometers Electron
    China National Standards
  • GB/T 16516-1996
  • Quartz crystal units--A specification in the quality assessment system for Electronic components--Part 2:Sectional specification--Capability approval Electron
    China National Standards
  • GB/T 12273-1996
  • Quartz crystal units--A specification in the quality assessment system for Electronic components--Part 1:Generic specification Electron
    China National Standards
  • GB/T 16517-1996
  • Quartz crystal units--A specification in the quality assessment system for Electronic components--Part 3:Sectional specification--Qualification approval Electron
    China National Standards
  • GB/T 16518-1996
  • Specification of assessment for musical performance on Electronic organ Electron
    China National Standards
  • GB/T 16511-1996
  • Electrical and Electronic measuring equipment--Documentation Electron
    China National Standards
  • SJ 20595-1996
  • General specification for differential ware used in Electronic equipments Electron
    China Electronics Standards
  • SJ 50033/110-1996
  • Semiconductor optoElectronic devices. Detail specification for type GR9413 infrared light emitting diode Electron
    China Electronics Standards
  • SJ 50033/111-1996
  • Semiconductor optoElectronic devices. Detail specification for type GT16 Si.NPN phototransistor Electron
    China Electronics Standards
  • SJ 20609-1996
  • Electronic design interchange format Electron
    China Electronics Standards
  • SJ/T 10720-1996
  • Safety Terminology for Electronic products Electron
    China Electronics Standards
  • SJ/T 10708-1996
  • Quartz crystal units. A specification in the Quality Assessment System for Electronic Components. Part 3: Sectional specification. Qualification approval. Section 1:Blank detail specification Electron
    China Electronics Standards
  • SJ/T 10722-1996
  • Zircon power for use in Electronic glass Electron
    China Electronics Standards
  • SJ/T 10713-1996
  • Indoor Electronic controllers Electron
    China Electronics Standards
  • SJ/T 10718-1996
  • Examples for preparation of design documents of Electronic equipment Electron
    China Electronics Standards
  • SJ/T 10707-1996
  • Quartz crystal units. A specification in the Quality Assessment System for Electronic Components. Part 2: Sectional specification. Capability approval. Section 1:Blank detail specification Electron
    China Electronics Standards
  • SJ/T 10697-1996
  • Electromechanical switches for use in Electronic equipment. Part 5: Sectional specification for pushbutton switches. Section 1. Blank detail specification Electron
    China Electronics Standards
  • SJ/T 10719-1996
  • Examples for preparation of design documents used in Electronic equipments Electron
    China Electronics Standards
  • SJ/T 10714-1996
  • Standard practice for checking the operation characteristics of X-ray photoElectron spectrometers Electron
    China Electronics Standards
  • SJ/T 10694-1996
  • Test methods for electrostatic protection system in manufacturing Electronic products Electron
    China Electronics Standards
  • SJ/T 211.1-1996
  • Design documents for special equipment for Electronic industry. Part 1: Completeness of design documents Electron
    China Electronics Standards
  • SJ/T 37-1996
  • Model-drafting and designating methods of special equipment for Electronics industry Electron
    China Electronics Standards
  • SJ/T 211.3-1996
  • Design documents for special equipment for Electronic industry. Part 3: Format of design documents Electron
    China Electronics Standards
  • SJ/T 1635-1996
  • Basic identification colours and code indications for Electronics industrial pipelines Electron
    China Electronics Standards

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