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GB standards are the China national standards; Prefix code GB are Mandatory standards, GB/T are Recommended standards; All products or service must be compliance with GB standards; If you want to export products or services to huge Chinese market, need ensure they are meet the requirements of GB china national standards; We provide Chinese GB standards and English version GB standards Lookup, Translate, Download, Imported Commodity GB standards Testing and Compliance review services. |
| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 43226-2023 |
Single-event soft error time domain testing method for Semiconductor integrated circuits used in aerospace applications 宇航用半导体集成电路单粒子软错误时域测试方法 |
China National Standards Semiconductor integr |
 English PDF |
| GB/T 43061-2023 |
Semiconductor integrated circuit PWM controller test method 半导体集成电路 PWM控制器测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 43040-2023 |
Semiconductor integrated circuit AC/DC converter test method 半导体集成电路 AC/DC变换器测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42975-2023 |
Semiconductor integrated circuit driver test methods 半导体集成电路 驱动器测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42974-2023 |
Semiconductor integrated circuit flash memory (FLASH) 半导体集成电路 快闪存储器（FLASH） |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42973-2023 |
Semiconductor integrated circuit Digital-to-analog (DA) converter 半导体集成电路 数字模拟（DA）转换器 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42970-2023 |
Semiconductor integrated circuit video encoding and decoding circuit testing method 半导体集成电路 视频编解码电路测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42848-2023 |
Semiconductor integrated circuits - Test methods for direct digital frequency synthesizers 半导体集成电路 直接数字频率合成器测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42839-2023 |
Semiconductor integrated circuit Analog-to-digital (AD) converter 半导体集成电路 模拟数字（AD）转换器 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42838-2023 |
Semiconductor integrated circuit Hall circuit test method 半导体集成电路 霍尔电路测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42837-2023 |
Microwave Semiconductor integrated circuit amplifier 微波半导体集成电路 放大器 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42836-2023 |
Microwave Semiconductor integrated circuit mixer 微波半导体集成电路 混频器 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 42835-2023 |
Semiconductor integrated circuit system on chip (SoC) 半导体集成电路 片上系统（SoC） |
China National Standards Semiconductor integr |
English PDF |
| GB/T 7092-2021 |
Outline dimensions of Semiconductor integrated circuits 半导体集成电路外形尺寸 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 38345-2019 |
General design requirements of Semiconductor integrate circuit for space application 宇航用半导体集成电路通用设计要求 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 36474-2018 |
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM) 半导体集成电路 第三代双倍数据速率同步动态随机存储器 (DDR3 SDRAM)测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 36477-2018 |
Semiconductor integrated circuit—Measuring methods for flash memory 半导体集成电路 快闪存储器测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 35007-2018 |
Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry 半导体集成电路 低电压差分信号电路测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 35006-2018 |
Semiconductor integrated circuits—Measuring method of level converter 半导体集成电路 电平转换器测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14028-2018 |
Semiconductor integrated circuits—Measuring method of analogue switch 半导体集成电路 模拟开关测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 4377-2018 |
Semiconductor integrated circuits—Measuring method of voltage regulators 半导体集成电路 电压调整器测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 16525-2015 |
Semiconductor integrated circuits—Specification of leadframes for plastic leaded chip carrier package 半导体集成电路 塑料有引线片式载体封装引线框架规范 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 15878-2015 |
Semiconductor integrated circuits—Specification of leadframes for small outline package 半导体集成电路 小外形封装引线框架规范 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 15876-2015 |
Semiconductor integrated circuits—Specification of leadframes for plastic quad flat package 半导体集成电路 塑料四面引线扁平封装引线框架规范 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14112-2015 |
Semiconductor integrated circuits—Specification for stamped leadframes of plastic DIP 半导体集成电路 塑料双列封装冲制型引线框架规范 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 15877-2013 |
Semiconductor integrated circuits—Specification of DIP leadframes produced by etching 半导体集成电路 蚀刻型双列封装引线框架规范 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 12750-2006 |
Semiconductor devices―Integrated circuits―Part 11: Sectional specification for Semiconductor integrated circuits excluding hybrid circuits 半导体器件 集成电路 第11部分：半导体集成电路分规范(不包括混合电路) |
China National Standards Semiconductor integr |
English PDF |
| GB/T 19403.1-2003 |
Semiconductor devices--Integrated circuits--Part 11:Section 1:Internal visual examination for Semiconductor integrated circuits(excluding hybrid circuits) 半导体器件 集成电路 第11部分:第1篇:半导体集成电路 内部目检 (不包括混合电路) |
China National Standards Semiconductor integr |
English PDF |
| GB/T 6798-1996 |
Semiconductor integrated circuits--General principles of measuring methods of voltage comparators 半导体集成电路 电压比较器测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 4377-1996 |
Semiconductor integrated circuits--General principles of measuring methods of voltage regulator 半导体集成电路 电压调整器测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 3436-1996 |
Semiconductor integrated circuits--Series and products of operational amplifier 半导体集成电路 运算放大器系列和品种 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 15136-1994 |
General principles of measuring methods for quartz clock and watch circuits of Semiconductor integrated circuits 半导体集成电路石英钟表电路测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14862-1993 |
Junction-to-case thermal resistance test methods of packages for Semiconductor integrated circuits 半导体集成电路封装结到外壳热阻测试方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14129-1993 |
Series and productsfor TTL Semiconductor integrated circuits--Products of series PAL 半导体集成电路TTL电路系列和品种 PAL系列的品种 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 7092-1993 |
Outline dimensions of Semiconductor integratedcircuits 半导体集成电路外形尺寸 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14115-1993 |
General principles of measuring methods of Sample/Hold amplifiers for Semiconductor integrated circuits 半导体集成电路采样/保持放大器测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14114-1993 |
General principles of measuring methods of V/F and F/V converters for Semiconductor integrated circuits 半导体集成电路电压/频率和频率/电压转换器测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14032-1992 |
General principles of measuring methods of digital phase-locked loop for Semiconductor integrated circuits 半导体集成电路数字锁相环测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14031-1992 |
General principles of measuring methods of analogue phase-loop for Semiconductor integrated circuits 半导体集成电路模拟锁相环测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14030-1992 |
General principles of measuring methods of timer circuits for Semiconductor integrated circuits 半导体集成电路时基电路测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14029-1992 |
General principles of measuring methods of analogue multiplier for Semiconductor integrated circuits 半导体集成电路模拟乘法器测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 14028-1992 |
General principles of measuring methods of analogue switches for Semiconductor integrated circuits 半导体集成电路模拟开关测试方法的基本原理 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 3430-1989 |
The rule of type designation for Semiconductor integrated circuits 半导体集成电路型号命名方法 |
China National Standards Semiconductor integr |
English PDF |
| GB/T 7509-1987 |
Blank detail specification for microprocessor Semiconductor integrated circuits 半导体集成电路微处理器空白详细规范 (可供认证用) |
China National Standards Semiconductor integr |
English PDF |
| GB/T 3431.2-1986 |
Letter symbols for Semiconductor integrated circuits--Letter symbols for function of pins 半导体集成电路文字符号 引出端功能符号 |
China National Standards Semiconductor integr |
English PDF |
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