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GB standards are the China national standards; Prefix code GB are Mandatory standards, GB/T are Recommended standards; All products or service must be compliance with GB standards; If you want to export products or services to huge Chinese market, need ensure they are meet the requirements of GB china national standards;  We provide Chinese GB standards and English version GB standards  Lookup, Translate, Download, Imported Commodity GB standards Testing and Compliance review services.
  •  China "semi" GB Standards List:
  • Standard  Code GB Standard Title Standard Class Order
  • GB/T 4377-2018
  • semiconductor integrated circuits—Measuring method of voltage regulators semi
    China National Standards
  • GB/T 35010.8-2018
  • semiconductor die products—Part8: EXPRESS model schema for data exchange semi
    China National Standards
  • GB/T 35010.1-2018
  • semiconductor die products—Part 1:Requirements for procurement and use semi
    China National Standards
  • GB/T 35010.7-2018
  • semiconductor die products—Part 7: XML schema for data exchange semi
    China National Standards
  • GB/T 14028-2018
  • semiconductor integrated circuits—Measuring method of analogue switch semi
    China National Standards
  • GB/T 35989.1-2018
  • Petroleum and natural gas industries—Floating offshore structures—Part 1: Monohulls, semi-submersibles and spars semi
    China National Standards
  • GB/T 35010.4-2018
  • semiconductor die products—Part 4: Requirements for die users and suppliers semi
    China National Standards
  • GB/T 35010.3-2018
  • semiconductor die products—Part 3: Guide for handling, packing and storage semi
    China National Standards
  • GB/T 35006-2018
  • semiconductor integrated circuits—Measuring method of level converter semi
    China National Standards
  • GB/T 36005-2018
  • Measuring methods of optical radiation safety for semiconductor lighting equipments and systems semi
    China National Standards
  • GB/T 35007-2018
  • semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry semi
    China National Standards
  • GB/T 35010.5-2018
  • semiconductor die products—Part 5:Requirements for concerning electrical simulation semi
    China National Standards
  • GB/T 35010.6-2018
  • semiconductor die products—Part 6: Requirements for concerning thermal simulation semi
    China National Standards
  • GB/T 35010.2-2018
  • semiconductor die products—Part 2: Exchange data formats semi
    China National Standards
  • GB/T 35897-2018
  • Pyropia yezoensis—Technical protocols for semi-floating raft cultivation semi
    China National Standards
  • GB/T 34971-2017
  • Guide for gaseous effluent handling in semiconductor industry semi
    China National Standards
  • GB/T 5226.33-2017
  • Electrical safety of machinary—Electrical equipment of machines—Part 33: Requirements for semiconductor fabrication equipment semi
    China National Standards
  • GB/T 34507-2017
  • Palladium coated copper bonding wire for semiconductor package semi
    China National Standards
  • GB/T 34502-2017
  • Gold-coated silver and silver alloy bonding wires for semiconductor package semi
    China National Standards
  • GB/T 34383-2017
  • semi-straight side press semi
    China National Standards
  • HJ 834-2017
  • (Soil and sediment - Determination of semi - volatile organic compounds - Gas chromatographic - mass spectrometry) semi
    China Environmental Protection Industry Standards
  • GB/T 33862-2017
  • Automatic(semi)Kjeldahl analyzer semi
    China National Standards
  • GB/T 15651.4-2017
  • semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers semi
    China National Standards
  • GB/T 33709-2017
  • Mobile laboratory—Guidance on dissemination and traceability of the value of equipment semi
    China National Standards
  • GB/T 249-2017
  • The rule of type designation for discrete semiconductor devices semi
    China National Standards
  • JT/T 1100-2016
  • (semi-trailer towers) semi
    China Highway & Transportation Standards
  • GB/T 14048.12-2016
  • Low-voltage switchgear and controlgear—Part 4-3: Contactors and motor-starters—AC semiconductor controllers and contactors for non-motor loads semi
    China National Standards
  • GB/T 14048.6-2016
  • Low-voltage switchgear and controlgear—Part 4-2: Contactors and motor-starters—AC semiconductor motor controllers and starters (including soft-starters) semi
    China National Standards
  • GB/T 32973-2016
  • Technical specification for hot charging and hot delivery of semi-closed arc furnace semi
    China National Standards
  • GB/T 32817-2016
  • semiconductor devices—Micro-electromechanical devices—Generic specification for MEMS semi
    China National Standards
  • SJ/T 11577-2016
  • (SJ/T 11394-2009 "semiconductor light-emitting diode test method" Application Guide) semi
    China Electronics Standards
  • SJ/T 2749-2016
  • (The semiconductor laser diode test) semi
    China Electronics Standards
  • SJ/T 2658.15-2016
  • (The semiconductor infrared emitting diodes measuring methods - Part 15: Thermal resistance) semi
    China Electronics Standards
  • SJ/T 2658.16-2016
  • (The semiconductor infrared emitting diodes measuring methods - Part 16: photoelectric conversion efficiency) semi
    China Electronics Standards
  • SJ/T 2658.14-2016
  • (The semiconductor infrared emitting diodes measuring methods - Part 14: Junction Temperature) semi
    China Electronics Standards
  • SJ/T 11586-2016
  • (The semiconductor device 10keV low-energy X-ray test method for total dose radiation) semi
    China Electronics Standards
  • GB/T 13539.4-2016
  • Low-voltage fuses—Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices semi
    China National Standards
  • SJ/T 1477-2016
  • (Discrete semiconductor devices 3CG120 high frequency low power silicon PNP transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1486-2016
  • (Discrete semiconductor devices 3CG180 silicon PNP frequency high power transistor backpressure small detail specification) semi
    China Electronics Standards
  • SJ/T 1472-2016
  • (Discrete semiconductor devices 3CG110 high frequency low power silicon PNP transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1826-2016
  • (semiconductor discrete device 3DK100 silicon NPN low power switching transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1480-2016
  • (Discrete semiconductor devices 3CG130 high frequency low power silicon PNP transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1831-2016
  • (semiconductor discrete device 3DK28 silicon NPN low power switching transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1838-2016
  • (semiconductor discrete device 3DK29 silicon NPN low power switching transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1839-2016
  • (semiconductor discrete device 3DK108 silicon NPN low power switching transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1834-2016
  • (semiconductor discrete device 3DK104 silicon NPN low power switching transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1833-2016
  • (semiconductor discrete device 3DK103 silicon NPN low power switching transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1830-2016
  • (semiconductor discrete device 3DK101 silicon NPN low power switching transistor detailed specification) semi
    China Electronics Standards
  • SJ/T 1832-2016
  • (semiconductor discrete device 3DK102 silicon NPN low power switching transistor detailed specification) semi
    China Electronics Standards
  • YY 1289-2016
  • (Laser therapy equipment ophthalmic semiconductor laser photocoagulation instrument) semi
    China Medicine & Medical Device Standards
  • GB/T 4023-2015
  • semiconductor devices—Discrete devices and integrated circuits— Part 2: Rectifier diodes semi
    China National Standards
  • GB/T 15291-2015
  • semiconductor devices—Part 6: Thyristors semi
    China National Standards
  • GB/T 19199-2015
  • Test method for carbon acceptor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy semi
    China National Standards
  • GB/T 17170-2015
  • Test method for the EL2 deep donor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy semi
    China National Standards
  • SJ/T 2658.3-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 3: Reverse voltage and reverse current semi
    China Electronics Standards
  • SJ/T 2658.10-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 10: Modulation bandwidth semi
    China Electronics Standards
  • SJ/T 2658.4-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 4: Total capacitance semi
    China Electronics Standards
  • SJ/T 2658.1-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 1: General semi
    China Electronics Standards
  • SJ/T 2658.12-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 12: Peak-emission wavelength and spectral radiant bandwidth semi
    China Electronics Standards
  • SJ/T 2658.8-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 8: Radiant intensity semi
    China Electronics Standards
  • SJ/T 2658.11-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 11: Response time semi
    China Electronics Standards
  • SJ/T 2658.2-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 2: Forward voltage semi
    China Electronics Standards
  • SJ/T 2658.5-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 5: Series connection resistance semi
    China Electronics Standards
  • SJ/T 2658.7-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 7: Radiant flux semi
    China Electronics Standards
  • SJ/T 2658.13-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 13: Temperature coefficient for radiant power semi
    China Electronics Standards
  • SJ/T 2658.6-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 6: Radiant power semi
    China Electronics Standards
  • SJ/T 10414-2015
  • (The semiconductor device with solder) semi
    China Electronics Standards
  • SJ/T 2658.9-2015
  • Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle semi
    China Electronics Standards
  • GB/T 4085-2015
  • semirigid polyvinyl chloride floor tiles semi
    China National Standards
  • GB/T 15878-2015
  • semiconductor integrated circuits—Specification of leadframes for small outline package semi
    China National Standards
  • GB/T 15876-2015
  • semiconductor integrated circuits—Specification of leadframes for plastic quad flat package semi
    China National Standards
  • GB/T 14112-2015
  • semiconductor integrated circuits—Specification for stamped leadframes of plastic DIP semi
    China National Standards
  • GB/T 16525-2015
  • semiconductor integrated circuits—Specification of leadframes for plastic leaded chip carrier package semi
    China National Standards
  • GB/T 31469-2015
  • semiconductor materials cutting fluid semi
    China National Standards
  • SJ/T 11488-2015
  • Test method for measuring resistivity, hall coefficient and determining hall mobility in semi-insulating GaAs single crystals semi
    China Electronics Standards
  • SJ/T 11487-2015
  • Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer semi
    China Electronics Standards
  • SJ/T 2215-2015
  • Measuring methods for semiconductor photocouplers semi
    China Electronics Standards
  • SJ/T 11520.8.4-2015
  • (Coaxial communication cables - Part 8-4: 50-141 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications) semi
    China Electronics Standards
  • SJ/T 11520.8.2-2015
  • (Coaxial communication cables - Part 8-2: 50-047 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications) semi
    China Electronics Standards
  • SJ/T 11520.8.9-2015
  • (Coaxial communication cables - Part 8-9: 75-250 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications) semi
    China Electronics Standards
  • SJ/T 2214-2015
  • Measuring methods for semiconductor photodiode and phototransistor semi
    China Electronics Standards
  • SJ/T 11520.8.8-2015
  • (Coaxial communication cables - Part 8-8: 75-141 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications) semi
    China Electronics Standards
  • SJ/T 11520.8.3-2015
  • (Coaxial communication cables - Part 8-3: 50-086 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications) semi
    China Electronics Standards
  • SJ/T 11520.8.5-2015
  • (Coaxial communication cables - Part 8-5: 50-250 polytetrafluoroethylene (PTFE) insulated semi-flexible cables detailed specifications) semi
    China Electronics Standards
  • YY/T 0998-2015
  • semiconductor heating and/or cooling therapy equipment semi
    China Medicine & Medical Device Standards
  • YY/T 1304.1-2015
  • Detection system of time-resolved fluoroimmenoassay. Part 1: semi-auto time-resolved fluoroimmunoassay analyser semi
    China Medicine & Medical Device Standards
  • GB/T 31359-2015
  • Test methods of semiconductor lasers semi
    China National Standards
  • GB/T 31358-2015
  • General specification for semiconductor lasers semi
    China National Standards
  • CJ/T 467-2014
  • semi-instantaneous water heater semi
    China Urban Construction industry Standards
  • GB/T 8750-2014
  • Gold bonding wire for semiconductor package semi
    China National Standards
  • GB/T 17951.2-2014
  • Cold-rolled non-oriented electrical steel strip delivered in the semi-processed state semi
    China National Standards
  • JT/T 886.1-2014
  • Technical requirements for swap trailer transport of road vehicles Part 1- semi-trailer towing vehicle semi
    China Highway & Transportation Standards
  • JT/T 886.2-2014
  • Technical requirements for swap trailer transport of road vehicles Part 2: semi-trailer semi
    China Highway & Transportation Standards
  • JT/T 885-2014
  • Safety detecting requirements and methods for commercial semi-trailer semi
    China Highway & Transportation Standards
  • HJ 691-2014
  • Ambient air. Sampling technical guideline of semi-volatile organic compounds (SVOCs) semi
    China Environmental Protection Industry Standards
  • GB/T 15877-2013
  • semiconductor integrated circuits—Specification of DIP leadframes produced by etching semi
    China National Standards
  • GB/T 30116-2013
  • Requirements for semiconductor manufacturing facility electromagnetic compatibility semi
    China National Standards
  • GB/T 17738.4-2013
  • Radio frequency and coaxial cable assemblies-Part 4: Sectional specification for semi-rigid coaxial cable assemblies semi
    China National Standards
  • GB 4793.9-2013
  • Safety requirements for electrical equipment for measurement, control and laboratory use―Part 9: Particular requirements for automatic and semi-automatic laboratory equipment for analysis and other purposes semi
    China National Standards
  • GB/T 17738.3-2013
  • Radio frequency and coaxial cable assemblies―Part 3:Sectional specification for semi-flexible coaxial cable assemiblies semi
    China National Standards

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