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    2. Other English version CNS Standards are not ready translated, only after get your order, then we translate them, time usually need more 3-5 days .
         
    CNS 13728 - English Version
    Rubber vocabulary
    橡膠詞彙 - 英文版

    CNS 13779 - English Version
    Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation)
    自動控制用紅外發光二極體量測法 - 英文版

    CNS 13780 - English Version
    Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test
    自動控制用紅外發光二極體耐久性試驗法-連續通電試驗 - 英文版

    CNS 13781 - English Version
    Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
    自動控制用紅外發光二極體耐久性試驗法-預燒試驗(順向偏壓) - 英文版

    CNS 13782 - English Version
    Realiability Assured Infrared Emitting Diodes (IRED)(for Automation)
    自動控制用可靠度保證紅外發光二極體 - 英文版

    CNS 14001 - English Version
    Environmental management systems − Requirements with guidance for use
    環境管理系統-附使用指引之要求事項 - 英文版

    CNS 13542 - English Version
    Low-voltage Metal-enclosed Switchgear
    低電壓金屬閉鎖型配電箱 - 英文版

    CNS 13791 - English Version
    Measuring Methods of Optical Attenuator for Communication
    通信用光衰減器量測法 - 英文版

    CNS 13655 - English Version
    Reliability Testing for Photodiode(for Communication)
    通信用光二極體之可靠度測試 - 英文版

    CNS 13793 - English Version
    Measuring Methods of Optical Isolators for Communication
    通信用光隔離器量測法 - 英文版

    CNS 13794 - English Version
    Measuring Methods of Optical Filter for Communication
    通信用光濾波器量測法 - 英文版

    CNS 13804 - English Version
    Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz
    應用置換法測量微波爐1GHz以上之輻射指引 - 英文版

    Translated
    CNS 13805 - English Version
    Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
    光電半導體晶圓之光激光譜量測法 - 英文版

    CNS 13806 - English Version
    Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes
    發光二極體磊晶片發光波長與亮度量測法 - 英文版

    CNS 13808 - English Version
    Epitaxial Wafers for Light Emitting Diodes
    發光二極體磊晶片 - 英文版

    CNS 13810 - English Version
    Lead Frames for Light Emitting Diodes
    發光二極體用支架 - 英文版

    CNS 13811 - English Version
    Numerical-Type Reflectors for Light Emitting Diodes
    發光二極體數字型反射套板 - 英文版

    CNS 13803 - English Version
    Industrial, scientific and medical equipment − Radio-frequency disturbance characteristics − Limits and methods of measurement
    工業、科學、醫療設備之射頻擾動特性的限制值與量測法 - 英文版

    CNS 13873 - English Version
    Method of test for kauri-butanol value of hydrocarbon solvents
    石油溶劑考立丁醇(KB)值試驗法 - 英文版

    CNS 13790 - English Version
    Measuring Methods of Fiber Optical Branching Components for Communication
    通信用光分歧元件量測法 - 英文版

    CNS 13635 - English Version
    Steel Butt-welding Pipe Fittings for Ordinary Use
    一般配管用鋼製對接銲接式管件 - 英文版

    CNS 13545 - English Version
    acoustics - Preferred Frequencies for Measurements
    聲學量測上優選的頻率 - 英文版

    CNS 13551 - English Version
    Bus for a.C. Metal-enclosed Switchgear and Controlgear
    金屬閉鎖型配電箱及控制箱用匯流排 - 英文版

    Translated
    CNS 13555 - English Version
    Method of test for tensile properties of carbon fiber reinforced plastics
    碳纖維強化塑膠抗拉性能試驗法 - 英文版

    CNS 13567 - English Version
    Method of Test for Sieving of Chemical Products
    化學製品篩分法 - 英文版

    CNS 13568 - English Version
    Method of Test for acid Value,Saponification Value,Ester Value,Iodine Value,Hydroxyl Value and Unsaponificable Matter of Chemical Products
    化學製品酸價、皂化價、酯價、碘價、羥價及不皂化物試驗法 - 英文版

    CNS 13575-3 - English Version
    Wheelchairs - Type Classification based on appearance characteristics
    輪椅-依外觀特性分類 - 英文版

    CNS 10471-1 - English Version
    Method of Test for Dirt in Paper and Paperboard
    紙及紙板內污點試驗法 - 英文版

    Translated
    CNS 13621 - English Version
    Polyamide Boxes for Conduits
    聚醯胺樹脂接線盒 - 英文版

    Translated
    CNS 13623 - English Version
    Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method)
    單晶片之電阻率、霍爾係數及霍爾移動率之測定法(范德普法) - 英文版


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