China National Standards
China SJ Standards Search System กก
  •  China "SJ" Standards List:
  • Standard  Code Standard English Title Standard Class Order
    SJ/T 3328.6-2016 (Electronic products with high purity quartz sand Part 6 Determination of copper)

    China Electronics - SJ Standards

    SJ/T 11104-2016 (Gold plating layer specification)

    China Electronics - SJ Standards

    SJ/Z 2808-2015 (PCB assembly Thermal Design)

    China Electronics - SJ Standards

    SJ/T 2658.9-2015 Measuring method for semiconductor infrared-emitting diode - Part 9: Spatial distribution of radiant intensity and half-intensity angle

    China Electronics - SJ Standards

    SJ/T 2658.8-2015 Measuring method for semiconductor infrared-emitting diode - Part 8: Radiant intensity

    China Electronics - SJ Standards

    SJ/T 2658.7-2015 Measuring method for semiconductor infrared-emitting diode - Part 7: Radiant flux

    China Electronics - SJ Standards

    SJ/T 2658.6-2015 Measuring method for semiconductor infrared-emitting diode - Part 6: Radiant power

    China Electronics - SJ Standards

    SJ/T 2658.5-2015 Measuring method for semiconductor infrared-emitting diode - Part 5: Series connection resistance

    China Electronics - SJ Standards

    SJ/T 2658.4-2015 Measuring method for semiconductor infrared-emitting diode - Part 4: Total capacitance

    China Electronics - SJ Standards

    SJ/T 2658.3-2015 Measuring method for semiconductor infrared-emitting diode - Part 3: Reverse voltage and reverse current

    China Electronics - SJ Standards

    SJ/T 2658.2-2015 Measuring method for semiconductor infrared-emitting diode - Part 2: Forward voltage

    China Electronics - SJ Standards

    SJ/T 2658.13-2015 Measuring method for semiconductor infrared-emitting diode - Part 13: Temperature coefficient for radiant power

    China Electronics - SJ Standards

    SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode - Part 12: Peak-emission wavelength and spectral radiant bandwidth

    China Electronics - SJ Standards

    SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode - Part 1: General

    China Electronics - SJ Standards

    SJ/T 2658.11-2015 Measuring method for semiconductor infrared-emitting diode - Part 11: Response time

    China Electronics - SJ Standards

    SJ/T 2658.10-2015 Measuring method for semiconductor infrared-emitting diode - Part 10: Modulation bandwidth

    China Electronics - SJ Standards

    SJ/T 2089-2015 Type designation for electronic measuring instruments

    China Electronics - SJ Standards

    SJ/T 11565.1-2015 (IT services consulting and design - Part 1: General requirements)

    China Electronics - SJ Standards

    SJ/T 11564.4-2015 (IT Services Operation and Maintenance Part 4: Data Center Specification)

    China Electronics - SJ Standards

    SJ/T 11563-2015 (Trusted Network software production process and environment)

    China Electronics - SJ Standards

    SJ/T 11562-2015 (Collaborative software development platform technical specifications)

    China Electronics - SJ Standards

    SJ/T 11561-2015 (Software component operating environment specification)

    China Electronics - SJ Standards

    SJ/T 11560-2015 (Audio amplifier energy efficiency limit value and energy efficiency rating for professional use Class D)

    China Electronics - SJ Standards

    SJ/T 11558.5-2015 (LED drive power - Part 5: Test methods)

    China Electronics - SJ Standards

    SJ/T 11557-2015 General specification for low-voltage composite switch

    China Electronics - SJ Standards

    SJ/T 11556-2015 (By atomic absorption spectrometry solvent nitric acid silver, gold, calcium, copper, iron, potassium and sodium content)

    China Electronics - SJ Standards

    SJ/T 11555-2015 (Determination of nitric acid metal elements by inductively coupled plasma mass spectrometry)

    China Electronics - SJ Standards

    SJ/T 11554-2015 (Inductively coupled plasma emission spectrometry hydrofluoric acid content of metal elements)

    China Electronics - SJ Standards

    SJ/T 11553-2015 (93% alumina ceramic vacuum electron)

    China Electronics - SJ Standards

    SJ/T 11552-2015 (In Brewster angle incidence P polarized radiation of infrared absorption spectroscopy measurements interstitial oxygen in silicon)

    China Electronics - SJ Standards


    Find out:3948Items   |  To Page of: First -Previous-Next -Last  | [5] [6] [7] [8] [9] [10] [11]

    กก
    กก

    +86-755-25831330        sales@gbstandards.org 
    106# Zhongmao Mansion,No.1 Beizhan Road,Shenzhen,China
    ©  RJS Copyright  2001-2024 All Rights Reserved

    - Since 2001 -
    Focus on China Standards & Compliance Services

    www.rjs.cn

    China Licenses

    www.transcustoms.com

    China HS code & Tariff

    www.gbstandards.org

    China National Standards