Cart:
| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| GB/T 14847-2010 |
Test mothod for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance 重掺杂衬底上轻掺杂硅外延层厚度的红外反射测量方法 |
China National Standards heavily |
 English PDF |
| GB/T 24580-2009 |
Test method for measuring boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry 重掺n型硅衬底中硼沾污的二次离子质谱检测方法 |
China National Standards heavily |
English PDF |
| Find out:2Items | To Page of: First -Previous-Next -Last | 1 |
+86-755-25831330
