China 'GB/T 4937.44-2025
' standard english version:
NATIONAL STANDARD OF THE PEOPLE'S REPUBLIC OF CHINA
GB/T 4937.44-2025
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 44: Test Method for Single-Event Effects (SEE) in Semiconductor Devices after Neutron Irradiation 半导体器件 - 机械和气候试验方法 - 第44部分：半导体器件的中子辐照单粒子效应（SEE）试验方法
Issued Date:2025/12/2
Implemented Date:2026/7/1
Issued by:
The Standardization Administration of the People's Republic of China
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