Cart:
| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| SJ/T 11552-2015 |
(In Brewster angle incidence P polarized radiation of infrared absorption spectroscopy measurements interstitial oxygen in silicon) 以布鲁斯特角入射p偏振辐射红外吸收光谱法测量硅中间隙氧含量 |
China Electronics
Standards interstitial |
 English PDF |
| SJ/T 11495-2015 |
Guide to conversion factors for interstitial oxygen in silicon 硅中间隙氧的转换因子指南 |
China Electronics
Standards interstitial |
English PDF |
| SJ/T 11491-2015 |
Test methods for measurement of interstitial oxygen content in silicon by short baseline infrared absorption spectrometry 短基线红外吸收光谱法测量硅中间隙氧含量 |
China Electronics
Standards interstitial |
English PDF |
| SJ/T 10625-1995 |
Determination method for interstitial atomic oxygen content of germanium by infrared abaorption 锗单晶体中间隙氧含量的红外吸收测定方法 |
China Electronics
Standards interstitial |
English PDF |
| Find out:4Items | To Page of: First -Previous-Next -Last | 1 |
+86-755-25831330
