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| Standard Code | Standard Title | Standard Class | Order |
|---|---|---|---|
| JJG(SJ)310005-2006 |
Specification for verification of high temperature dynamic aging system of integrated circuit |
China Metrological
Standards Specification verification high |
 English PDF |
| JJG 310005-2006 |
Specification for verification of high temperature dynamic aging system of integrated circuit |
China Metrological
Standards Specification verification high |
English PDF |
| JJG(SJ)04023-1989 |
Specification for verification of BJ2970 model high power semiconductor triode tf tester |
China Metrological
Standards Specification verification high |
English PDF |
| JJG(SJ)04022-1989 |
Specification for verification of Q01 model high frequency low power triode transistor Ft standard measurement meters |
China Metrological
Standards Specification verification high |
English PDF |
| JJG(SJ)04020-1989 |
Specification for verification of sample transistor specially intended to measure the noise factor of high frequency medium and low power triode transistor |
China Metrological
Standards Specification verification high |
English PDF |
| JJG(SJ)04011-1987 |
Trial specification for verification of QG21-QG25 high frequency low-power transistor F testers |
China Metrological
Standards Specification verification high |
English PDF |
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