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    SJ/T 10973-1996 Detailed specifications for electronic components - 3DD200 bipolar transistors for silicon NPN low frequency amplification case (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10972-1996 Detailed specifications for electronic components - 3DD207 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10969-1996 Detailed specifications for electronic components - 3DG2636 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10967-1996 Detailed specifications for electronic components - 3DD203 silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10915-1996 Measuring methods for meteorological facsimile (analogue)

    China Electronics - SJ Standards

    SJ/T 10840-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10101 ECL Quad 2-input OR/NOR gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11073-1996 Type SMA radio-frequency coaxial connectors

    China Electronics - SJ Standards

    SJ/T 10788-1996 Detailed specifications for electronic components - 3DG79 forward AGC low-noise transistor for high-frequency (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10966-1996 Detailed specifications for electronic components - 3DD100C silicon NPN case-rated transistors for low frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10849-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10121 ECL4-channel 3-3-3-3 input AND-OR/OR-NAND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10930-1996 Potassium silicate solution for use in electronic industry -- The methods of determination for chloride

    China Electronics - SJ Standards

    SJ/T 10780-1996 Electronic components detail specification CY-0, 1, 2, 3mica dielectric capacitors Assessment level E

    China Electronics - SJ Standards

    SJ/T 10868-1996 Measurement of the electrical properties of disk-seal tubes Measuring methods of sell neutralization frequency

    China Electronics - SJ Standards

    SJ/T 10921-1996 Potassium silicate solution for use in electronic industry. Methods for determination of potassium carbonate

    China Electronics - SJ Standards

    SJ/T 10919-1996 Packaging of color broadcasting TV receiver

    China Electronics - SJ Standards

    SJ/T 10749-1996 Detailed specifications for CJ11 fixed metalized paper dielectric DC capacitors

    China Electronics - SJ Standards

    SJ/T 10761-1996 Classification and designation of name and model of structure ceramic dielectric materials used for capacitors

    China Electronics - SJ Standards

    SJ/T 10956-1996 Detailed specifications for electronic components - 4CS122 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10841-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10102 ECL Quad 4-input NOR gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11031-1996 Analytical methods for gold copper and gold nickel brazing for electron device Determination of phosphorus by phosphorimetry

    China Electronics - SJ Standards

    SJ/T 11052-1996 Detailed specifications for electronic components - 3DG162 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11035-1996 Test method for chemical stability to resist water of electronic glass

    China Electronics - SJ Standards

    SJ/T 11002-1996 Detail specification for Electronic component fixed polypropylene film dielectric metal foil D.C capacitors, type CBB111 Assessment level E

    China Electronics - SJ Standards

    SJ/T 11024-1996 Analytical methods for silver copper brazing for electron device Determination of antimony by atomic absorption spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10842-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10104 ECL Quad 2-input AND gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10846-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10110 ECL dual 3-input OR gate (3-output) (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10789-1996 Detailed specifications for electronic components - 2CL24, 2CL25, 2CL27 and 2CL29 glass passivated and encapsulated high voltage silicon stacks (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11036-1996 Test method for average linear thermal expansion of electronic glass

    China Electronics - SJ Standards

    SJ/T 10807-1996 Detail specification for electronic component Glass passivated high voltage rectifier silicon stack for types 2CL61, 2CL62, 2CL63, 2CL64, 2CL65, 2CL66, 2CL67, 2CL68

    China Electronics - SJ Standards

    SJ/T 10954-1996 Detail specification for electronic component silicon switching diode for type 2CK120

    China Electronics - SJ Standards

    SJ/T 11054-1996 Detailed specifications for electronic components - 3DG140 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10945-1996 Type designation system for alundum powder for vacuum tubes

    China Electronics - SJ Standards

    SJ/T 11053-1996 Detailed specifications for electronic components - 3DG182 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10942-1996 Determination of sulfur (S) in color picture tube glass

    China Electronics - SJ Standards

    SJ/T 10852-1996 Detail specification for electronic components Type CD15 fixed aluminium electrolyte capacitors

    China Electronics - SJ Standards

    SJ/T 11037-1996 Test method for thermal shock of electronic glass

    China Electronics - SJ Standards

    SJ/T 10928-1996 Potassium silicate solution for use in electronic industry. The methods of determination for nickel

    China Electronics - SJ Standards

    SJ/T 10927-1996 Potassium silicate solution for use in electronic industry. The methods of determination for copper

    China Electronics - SJ Standards

    SJ/T 10867-1996 Measurement of the electrical properties of disk-seal tubes Measuring methods of resonator unloaded Q

    China Electronics - SJ Standards

    SJ/T 11045-1996 Type designation system for lithium batteries

    China Electronics - SJ Standards

    SJ/T 11046-1996 Lithium-iodine battery for cardiac pacemaker

    China Electronics - SJ Standards

    SJ/T 10817-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1054 TTL4-channel 2-2-2-2 input AND OR INVENT gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11072-1996 Type BNC radio-frequency coaxial connectors

    China Electronics - SJ Standards

    SJ/T 10733-1996 Types and dimensions of single-hole mounting bushes of electronic components

    China Electronics - SJ Standards

    SJ/T 10740-1996 Semiconductor integrated circuits - General principles of measuring methods for bipolar random access memories

    China Electronics - SJ Standards

    SJ/T 10907-1996 Determination of alumina (Al2O3) in electronic glass by EDTA complexicretric titration

    China Electronics - SJ Standards

    SJ/T 10898-1996 Determination of iron oxide and titania in electronic glass by photometric method

    China Electronics - SJ Standards

    SJ/T 10855-1996 Detail specification for electronic components Type CD27 fixed aluminium electrolyte capacitors

    China Electronics - SJ Standards

    SJ/T 10968-1996 Detailed specifications for electronic components - 3DD205A silicon NPN case-rated transistors for high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11081-1996 Preparation of outline drawings of cathode-ray tubes

    China Electronics - SJ Standards

    SJ/T 10998-1996 Detail specification for Electronic component Fixed polypropylene film dielectric metal foil D.C capacitors, type CBB13 Assessment level E

    China Electronics - SJ Standards

    SJ/T 10986-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5250CP SIF amplifiers

    China Electronics - SJ Standards

    SJ/T 11094-1996 The performance parameter and methods of measurement for medical X-ray image intensifier television system

    China Electronics - SJ Standards

    SJ/T 11085-1996 General specification for vertical turbomolecular pumps

    China Electronics - SJ Standards

    SJ/T 10832-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7611CP PIF amplifying circuits

    China Electronics - SJ Standards

    SJ/T 11097-1996 Test methods of radiation pattern of the slotted-waveguide antenna for marine radar

    China Electronics - SJ Standards

    SJ/T 10989-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5622CP PAL system chrominance signal processing circuits

    China Electronics - SJ Standards

    SJ/T 10992-1996 Detailed specifications for electronic components - 2CW412-473 voltage-regulating diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10920-1996 Test methods for transport packages of broadcasting TV receiver

    China Electronics - SJ Standards

    SJ/T 10983-1996 Detail Specification of DC2 type flat cable connector

    China Electronics - SJ Standards

    SJ/T 10777-1996 Detail specification for electronic components Fixed ceramic dielectric capacitors type CC1 Assessment level E

    China Electronics - SJ Standards

    SJ/T 10854-1996 Detail specification for electronic components Type CD26 fixed aluminium electrolyte capacitors

    China Electronics - SJ Standards

    SJ/T 10810-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CT1004 TTL Hex inverters (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 11038-1996 Test method for softening point of electronic glass

    China Electronics - SJ Standards

    SJ/T 10917-1996 Performance requirements for camera tube yoke assemblies

    China Electronics - SJ Standards

    SJ/T 11050-1996 Prepreg materials for bonding sheets in the fabrication of multilayer printed boards

    China Electronics - SJ Standards

    SJ/T 11067-1996 Commonly used terms for semiconductor photoelectric materials and pyroelectricmaterials in infrared detecting materials

    China Electronics - SJ Standards

    SJ/T 10738-1996 Semiconductor integrated circuits - General principles of measuring methods for operational (voltage) amplifiers

    China Electronics - SJ Standards

    SJ/T 10743-1996 Ceriated tungsten electrodes for inert gas arc welding and plasma welding and cutting

    China Electronics - SJ Standards

    SJ/T 11098-1996 Test methods of VSWR of the waveguide feed-system for marine radar

    China Electronics - SJ Standards

    SJ/T 10895-1996 Determination of CaO SrO and MgO in electronic glass by atomic absorption

    China Electronics - SJ Standards

    SJ/T 11060-1996 Detailed specifications for electronic components - 3DG3130 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10874-1996 Detail specification for electronic components Fixed metallized polyethylene-terephthalate film dielectric DC capacitors Type CL21 Assessment level E

    China Electronics - SJ Standards

    SJ/T 11011-1996 Analytical methods for pure silver brazing for electron device. Determination of lead by dithizone spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10795-1996 General purpose rigid coaxial transmission lines and their associated flange connectors Detail specification

    China Electronics - SJ Standards

    SJ/T 11028-1996 Analytical methods for gold copper brazing for electron device Determination of copper by EDTA volumetry

    China Electronics - SJ Standards

    SJ/T 11012-1996 Analytical methods for pure silver brazing for electron device Determination of magnesium and zinc by atomic absorption spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10831-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits

    China Electronics - SJ Standards

    SJ/T 11010-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD1124ACP SIF amplifying circuits

    China Electronics - SJ Standards

    SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits

    China Electronics - SJ Standards

    SJ/T 10826-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0450 HTL dual peripheral positive AND drivers

    China Electronics - SJ Standards

    SJ/T 10953-1996 Detailed specifications for electronic components - 2CZ324Q ambient-rated silicon rectifier diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10844-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CE10106 ECL Triple 4, 3, 3-input NOR gate (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10979-1996 Detailed specifications for electronic components - 2CC22 and 2CC27 silicon tuning variable capacitance diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10980-1996 Detailed specifications for electronic components - 2CC23 and 2CC28 silicon tuning variable capacitance diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10821-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2007 HTL Quad inverters

    China Electronics - SJ Standards

    SJ/T 10977-1996 Detailed specifications for electronic components - 2CK111, 2CK112 and 2CK113 silicon switching diodes (Applicable for certification)

    China Electronics - SJ Standards

    SJ/T 10937-1996 Method for measurement of chromaticity coordinates for color picture tube glass panel

    China Electronics - SJ Standards

    SJ/T 10786-1996 Detail specification for electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL11 Assessment level E

    China Electronics - SJ Standards

    SJ/T 10820-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CH2001 HTL dual 4-input positive-NAND gate

    China Electronics - SJ Standards

    SJ/T 11016-1996 Analytical methods for pure silver brazing for electron device Determination of bismuth by strychnine-potassium iodide spectrophotometry

    China Electronics - SJ Standards

    SJ/T 10746-1996 Procedures and rules for pattern evaluation of new products for semiconductor integrated circuits

    China Electronics - SJ Standards

    SJ/T 10747-1996 colour codes for wire leads of microwave devices

    China Electronics - SJ Standards

    SJ/T 11051-1996 Specifications for printed boards for TV broadcast receivers

    China Electronics - SJ Standards

    SJ/T 10759-1996 Dimensions of plugs for hearing aids

    China Electronics - SJ Standards

    SJ/T 10763-1996 Basic size of the ribbon spools for drum line printers

    China Electronics - SJ Standards

    SJ/T 11061-1996 Inspection procedures for electrical performance test equipments for solar cells

    China Electronics - SJ Standards

    SJ/T 10905-1996 Determination of lead oxide in electronic glass

    China Electronics - SJ Standards

    SJ/T 10936-1996 Method of measurement for residue stress in color picture tube bulbs

    China Electronics - SJ Standards

    SJ/T 10903-1996 Determination of boron (B2O3) in electronic glass

    China Electronics - SJ Standards


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